Wang Jinyong, Li Pengda, Hu Jiaxuan, Zhang Ce
School of Automation and Software Engineering, Shanxi University, Taiyuan, People's Republic of China.
School of Computer Science and Technology, Harbin Institute of Technology at Weihai, Weihai, People's Republic of China.
Sci Rep. 2024 Aug 23;14(1):19576. doi: 10.1038/s41598-024-70536-x.
With the development of open source software (OSS), software reliability has become an important issue. Due to the complexity of OSS development and testing environment, the fault detection rate of OSS will show a variety of changes. The existing OSS reliability models cannot fully adapt to the complex changes of OSS fault detection. In this paper, we proposed a multi-release OSS reliability model based on three-parameter lifetime distribution. The proposed model can effectively adapt to the complicated changes of fault detection in the processes of development and testing of OSS. Experimental results indicate that the proposed model has the better fitting and predictive performance compared with other multi-release OSS reliability models. Moreover, the proposed model can better adapt to the variety of OSS fault detection environment, and assist developers to evaluate the reliability of OSS.
随着开源软件（OSS）的发展，软件可靠性已成为一个重要问题。由于OSS开发和测试环境的复杂性，OSS的故障检测率会呈现出多种变化。现有的OSS可靠性模型无法完全适应OSS故障检测的复杂变化。在本文中，我们提出了一种基于三参数寿命分布的多版本OSS可靠性模型。所提出的模型能够有效适应OSS开发和测试过程中故障检测的复杂变化。实验结果表明，与其他多版本OSS可靠性模型相比，所提出的模型具有更好的拟合和预测性能。此外，所提出的模型能够更好地适应各种OSS故障检测环境，并协助开发者评估OSS的可靠性。
