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注入到β-GaO中的镱的晶格恢复与光学激活

Crystal Lattice Recovery and Optical Activation of Yb Implanted into β-GaO.

作者信息

Sarwar Mahwish, Ratajczak Renata, Ivanov Vitalii Yu, Gieraltowska Sylwia, Wierzbicka Aleksandra, Wozniak Wojciech, Heller René, Eisenwinder Stefan, Guziewicz Elżbieta

机构信息

Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/46, 02-668 Warsaw, Poland.

National Centre for Nuclear Research, Soltana 7, 05-400 Otwock, Poland.

出版信息

Materials (Basel). 2024 Aug 10;17(16):3979. doi: 10.3390/ma17163979.

DOI:10.3390/ma17163979
PMID:39203157
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11356592/
Abstract

β-GaO is an ultra-wide bandgap semiconductor (E~4.8 eV) of interest for many applications, including optoelectronics. Undoped GaO emits light in the UV range that can be tuned to the visible region of the spectrum by rare earth dopants. In this work, we investigate the crystal lattice recovery of (2¯01)-oriented β-GaO crystals implanted with Yb ions to the fluence of 1 ×10 at/cm. Post-implantation annealing at a range of temperature and different atmospheres was used to investigate the β-GaO crystal structure recovery and optical activation of Yb ions. Ion implantation is a renowned technique used for material doping, but in spite of its many advantages such as the controlled introduction of dopants in concentrations exceeding the solubility limits, it also causes damage to the crystal lattice, which strongly influences the optical response from the material. In this work, post-implantation defects in β-GaO:Yb crystals, their transformation, and the recovery of the crystal lattice after thermal treatment have been investigated by channeling Rutherford backscattering spectrometry (RBS/c) supported by McChasy simulations, and the optical response was tested. It has been shown that post-implantation annealing at temperatures of 700-900 °C results in partial crystal lattice recovery, but it is accompanied by the out-diffusion of Yb ions toward the surface if the annealing temperature and time exceed 800 °C and 10 min, respectively. High-temperature implantation at 500-900 °C strongly limits post-implantation damage to the crystal lattice, but it does not cause the intense luminescence of Yb ions. This suggests that the recovery of the crystal lattice is not a sufficient condition for strong rare-earth photoluminescence at room temperature and that oxygen annealing is beneficial for intense infrared luminescence compared to other tested environments.

摘要

β-GaO是一种超宽带隙半导体(E~4.8 eV),在包括光电子学在内的许多应用中都备受关注。未掺杂的GaO在紫外范围内发光,通过稀土掺杂剂可将其调谐到光谱的可见光区域。在这项工作中,我们研究了注入Yb离子至通量为1×10 at/cm的(2¯01)取向β-GaO晶体的晶格恢复情况。在一系列温度和不同气氛下进行植入后退火,以研究β-GaO晶体结构的恢复以及Yb离子的光学激活。离子注入是一种用于材料掺杂的著名技术,尽管它有许多优点,如能以超过溶解度极限的浓度可控地引入掺杂剂,但它也会对晶格造成损伤,这对材料的光学响应有很大影响。在这项工作中,通过通道卢瑟福背散射光谱(RBS/c)并辅以McChasy模拟,研究了β-GaO:Yb晶体中的植入后缺陷、它们的转变以及热处理后晶格的恢复情况,并测试了光学响应。结果表明,在700-900°C的温度下进行植入后退火会导致部分晶格恢复,但如果退火温度和时间分别超过800°C和10分钟,会伴随着Yb离子向表面的外扩散。在500-900°C下进行高温注入会强烈限制植入后对晶格的损伤,但不会引起Yb离子的强烈发光。这表明晶格恢复不是室温下强稀土光致发光的充分条件,并且与其他测试环境相比,氧退火有利于产生强烈的红外发光。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/2590615be3e2/materials-17-03979-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/aff863462028/materials-17-03979-g001.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/5234fc5eec4b/materials-17-03979-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/9666a9b6b1c3/materials-17-03979-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/2f115d727374/materials-17-03979-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/eb3f8830be51/materials-17-03979-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/38952159c44d/materials-17-03979-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/23ef4c2dfc55/materials-17-03979-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/2590615be3e2/materials-17-03979-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/aff863462028/materials-17-03979-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/968d3c44b041/materials-17-03979-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/1fd42d047d85/materials-17-03979-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/5234fc5eec4b/materials-17-03979-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/9666a9b6b1c3/materials-17-03979-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/2f115d727374/materials-17-03979-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/eb3f8830be51/materials-17-03979-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/38952159c44d/materials-17-03979-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/23ef4c2dfc55/materials-17-03979-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3756/11356592/2590615be3e2/materials-17-03979-g010.jpg

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