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用于电催化的纳米TiO/TiN系统:绘制半导体|集电器界面处能带图的变化以及利用紫外光电子能谱研究TiO电化学还原的影响。

Nano-TiO/TiN Systems for Electrocatalysis: Mapping the Changes in Energy Band Diagram across the Semiconductor|Current Collector Interface and the Study of Effects of TiO Electrochemical Reduction Using UV Photoelectron Spectroscopy.

作者信息

de la Fuente Beatriz, Khurana Divyansh A, Vereecken Philippe M, Hubin Annick, Hauffman Tom

机构信息

Research Group Sustainable Materials Engineering (SUME), Lab of Electrochemical and Surface Engineering (SURF), Vrije Universiteit Brussel, Pleinlaan 2, Brussels 1050, Belgium.

KU-Leuven Centre for Membrane Separations, Adsorption, Catalysis, and Spectroscopy for Sustainable Solutions, Leuven 3001, Belgium.

出版信息

ACS Appl Mater Interfaces. 2024 Sep 18;16(37):49926-49934. doi: 10.1021/acsami.4c09736. Epub 2024 Sep 4.

Abstract

TiO is the most widely used material in photoelectrocatalytic systems. A key parameter to understand its efficacy in such systems is the band bending in the semiconductor layer. In this regard, knowledge on the band energetics at the semiconductor/current collector interface, especially for a nanosemiconductor electrode, is extremely vital as it will directly impact any charge transfer processes at its interface with the electrolyte. Since direct investigation of interfacial electronic features without compromising its structure is difficult, only seldom are attempts made to study the semiconductor/current collector interface specifically. This work utilizes ultraviolet photoelectron spectroscopy (UPS) to determine the valence band maximum () and Fermi level () at different depths in a nano-TiO/TiN thin-film system reached using an Ar gas-clustered ion beam (GCIB). By combining UPS with GCIB depth profiling, we report an innovative approach for truly mapping the energy band structure across a nanosemiconductor/current collector interface. By coupling it with X-ray photoelectron spectroscopy (XPS), correlations among chemistry, chemical bonding, and electronic properties for the nano-TiO/TiN interface could also be studied. The effects of TiO in situ electrochemical reduction in aqueous electrolytes are also investigated where UPS confirmed a decrease in the semiconductor work function (WF) and an associated increase in n-type Ti centers of nano-TiO electrodes post use in a 0.2 M potassium chloride solution. We report the use of UPS to precisely determine the energy band diagrams for a nano-TiO/TiN thin-film interface and confirm the increase in TiO n-type dopant concentrations during electrocatalysis, promoting a much more comprehensive and intuitive understanding of the TiO activation mechanism by proton intercalation and therefore further optimizing the design process of efficient photocatalytic materials for solar conversion.

摘要

二氧化钛是光电催化系统中使用最广泛的材料。了解其在此类系统中功效的一个关键参数是半导体层中的能带弯曲。在这方面,了解半导体/集电器界面处的能带能量学,特别是对于纳米半导体电极,极其重要,因为它将直接影响其与电解质界面处的任何电荷转移过程。由于在不破坏其结构的情况下直接研究界面电子特征很困难,因此专门研究半导体/集电器界面的尝试很少。这项工作利用紫外光电子能谱(UPS)来确定使用氩气团簇离子束(GCIB)在纳米TiO/TiN薄膜系统不同深度处的价带最大值()和费米能级()。通过将UPS与GCIB深度剖析相结合,我们报告了一种创新方法,用于真正绘制跨越纳米半导体/集电器界面的能带结构。通过将其与X射线光电子能谱(XPS)相结合,还可以研究纳米TiO/TiN界面的化学性质、化学键和电子性质之间的相关性。还研究了TiO在水性电解质中原位电化学还原的影响,其中UPS证实了在0.2 M氯化钾溶液中使用后纳米TiO电极的半导体功函数(WF)降低以及n型Ti中心相关增加。我们报告了使用UPS精确确定纳米TiO/TiN薄膜界面的能带图,并证实了电催化过程中TiO n型掺杂剂浓度的增加,促进了对质子嵌入TiO活化机制更全面和直观的理解,从而进一步优化用于太阳能转换的高效光催化材料的设计过程。

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