Zaniboni Joissi Ferrari, Silva Amanda Soares, Silva Aryvelto Miranda, Besegato João Felipe, Muñoz-Chávez Oscar Fernando, de Campos Edson Alves
Department of Restorative Dentistry, School of Dentistry, Araraquara, São Paulo State University (UNESP), Araraquara, São Paulo, Brazil.
School of Dentistry (FAODO), Federal University of Mato Grosso do Sul (UFMS), Campo Grande, Mato Grosso do Sul, Brazil.
J Prosthodont. 2024 Sep 4. doi: 10.1111/jopr.13938.
To analyze the microstructural and mechanical properties of various commercial trademarks of lithium disilicate ceramics for CAD-CAM systems.
Specimens of different lithium disilicate ceramics were obtained and randomized into 5 groups (n = 14): EM: e.max CAD; RT: Rosetta SM; EV: Evolith; PM: Smile-Lithium CAD; and, HS: HaHaSmile. The microstructural analysis was performed by X-ray diffraction (XRD) and scanning electron microscopy (SEM); for flexural strength, the three-point bending flexure test was used. XRD and SEM data were qualitatively evaluated. Data from flexural strength were assessed with one-way ANOVA test (α = 0.05) and Weibull analysis.
High peaks corresponding to the lithium metasilicate and lithium disilicate pattern with similar intensities were observed in all ceramics in the XRD analysis. SEM images showed similar patterns of crystalline structure in the EM and RT ceramics, while the other three groups presented different crystal morphologies than the previous ones and were similar to each other. No differences were found in flexural strength among the groups (p = 0.28).
The CAD-CAM lithium disilicate ceramics showed comparable crystalline intensities. The microstructure of the EM and RT ceramics were different from the other groups. Flexural strength was similar among all ceramics.
分析用于计算机辅助设计与制造（CAD-CAM）系统的各种商用品牌硅酸锂陶瓷的微观结构和力学性能。
获取不同硅酸锂陶瓷的样本，并随机分为5组（n = 14）：EM：e.max CAD；RT：Rosetta SM；EV：Evolith；PM：Smile-Lithium CAD；以及HS：HaHaSmile。通过X射线衍射（XRD）和扫描电子显微镜（SEM）进行微观结构分析；对于弯曲强度，采用三点弯曲试验。对XRD和SEM数据进行定性评估。弯曲强度数据采用单因素方差分析（α = 0.05）和威布尔分析进行评估。
在XRD分析中，所有陶瓷中均观察到对应于偏硅酸锂和硅酸锂模式的高峰，强度相似。SEM图像显示，EM和RT陶瓷的晶体结构模式相似，而其他三组呈现出与前两者不同的晶体形态，且彼此相似。各组之间的弯曲强度未发现差异（p = 0.28）。
CAD-CAM硅酸锂陶瓷显示出相当的晶体强度。EM和RT陶瓷的微观结构与其他组不同。所有陶瓷的弯曲强度相似。
