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通过光谱和成像技术阐明氩气冷等离体射流的细菌灭活机制。

Elucidating the bacterial inactivation mechanism by argon cold atmospheric pressure plasma jet through spectroscopic and imaging techniques.

机构信息

School of Interdisciplinary Research, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India.

Department of Microbiology, All India Institute of Medical Sciences, Ansari Nagar, New Delhi 110029, India.

出版信息

J Appl Microbiol. 2024 Sep 2;135(9). doi: 10.1093/jambio/lxae238.

Abstract

AIMS

This study aims to assess the potential bacterial inactivation pathway triggered by argon (Ar) cold atmospheric pressure plasma jet (CAPJ) discharge using spectroscopic and imaging techniques.

METHODS AND RESULTS

Electrical and reactive species of the Ar CAPJ discharge was characterized. The chemical composition and morphology of bacteria pre- and post-CAPJ exposure were assessed using Fourier transform infrared (FTIR), Raman micro-spectroscopy, and transmission electron microscopy (TEM). A greater than 6 log reduction of Escherichia coli and Staphylococcus aureus was achieved within 60 and 120 s of CAPJ exposure, respectively. Extremely low D-values (<20 s) were recorded for both the isolates. The alterations in the FTIR spectra and Raman micro-spectra signals of post-CAPJ exposed bacteria revealed the degree of destruction at the molecular level, such as lipid peroxidation, protein oxidation, bond breakages, etc. Further, TEM images of exposed bacteria indicated the incurred damages on cell morphology by CAPJ reactive species. Also, the inactivation process varied for both isolates, as evidenced by the correlation between the inactivation curve and FTIR spectra. It was observed that the identified gas-phase reactive species, such as Ar I, O I, OH•, NO+, OH+, NO2-, NO3-, etc. played a significant role in bacterial inactivation.

CONCLUSIONS

This study clearly demonstrated the effect of CAPJ exposure on bacterial cell morphology and molecular composition, illuminating potential bacterial inactivation mechanisms.

摘要

目的

本研究旨在利用光谱和成像技术评估氩气(Ar)冷等压大气压等离子射流(CAPJ)放电触发的潜在细菌灭活途径。

方法和结果

对 Ar CAPJ 放电的电气和反应性物种进行了表征。使用傅里叶变换红外(FTIR)、拉曼微光谱和透射电子显微镜(TEM)评估了细菌暴露于 CAPJ 前后的化学组成和形态。在 CAPJ 暴露 60 和 120 秒内,大肠杆菌和金黄色葡萄球菌的对数减少大于 6。两种分离物的 D 值(<20 秒)均极低。暴露于 CAPJ 后细菌的 FTIR 光谱和拉曼微光谱信号的变化揭示了分子水平上的破坏程度,例如脂质过氧化、蛋白质氧化、键断裂等。此外,暴露细菌的 TEM 图像表明 CAPJ 反应性物质对细胞形态造成的损伤。此外,正如灭活曲线与 FTIR 光谱之间的相关性所证明的那样,两种分离物的灭活过程不同。观察到,诸如 Ar I、O I、OH•、NO+、OH+、NO2-、NO3-等鉴定的气相反应性物种在细菌灭活中起重要作用。

结论

本研究清楚地表明了 CAPJ 暴露对细菌细胞形态和分子组成的影响,阐明了潜在的细菌灭活机制。

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