Yeh Ching-Chen, Liao Pin-Chi, Yang Yanfei, Lin Wei-Chen, Panna Alireza R, Rigosi Albert F, Elmquist Randolph E, Liang Chi-Te
<a href="https://ror.org/05xpvk416">National Institute of Standards and Technology (NIST)</a>, Gaithersburg, Maryland 20899, USA.
Department of Physics, <a href="https://ror.org/05bqach95">National Taiwan University</a>, Taipei 106, Taiwan.
Phys Rev Lett. 2024 Aug 30;133(9):096302. doi: 10.1103/PhysRevLett.133.096302.
The quantum Hall (QH) effect is one of the most widely studied physical phenomenon in two dimensions. The plateau-plateau transition within this effect can be comprehensively described by the scaling theory, which encompasses three pivotal exponents: the critical exponent κ, the inelastic scattering exponent p, and the universal exponent γ. Prior studies have focused on measuring κ and estimating γ, assuming a constant p value of 2 across magnetic fields. Here, our work marks a significant advancement by measuring all three exponents within a single graphene device and a conventional two-dimensional electron system. This study uniquely determines p at low magnetic fields (weak localization region and well outside the QH regime) and high magnetic fields (in the vicinity of the QH regime). Employing a comprehensive analytical approach that includes weak localization, plateau-plateau transitions, and variable range hopping, we have directly determined κ, p, and γ. Our findings reveal a distinct variation in p, shifting from 1 in the low magnetic field regime to 2 in the QH regime in graphene.