Huang Li, Gan Yang
School of Electronics and Information Engineering, Hebei University of Technology, Tianjin 300130, PR China; Tianjin Key Laboratory of Electronic Materials and Devices, Hebei University of Technology, Tianjin 300130, PR China.
School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, PR China; MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage, School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, PR China.
Micron. 2024 Dec;187:103716. doi: 10.1016/j.micron.2024.103716. Epub 2024 Sep 11.
Atomic-thick graphene has stimulated great interests for exploring fundamental science and technological applications due to its promising electronic, mechanical and thermal properties. It is important to gain a deeper understanding of geometrical/structural characteristics of graphene and its properties/performance. Scanning electron microscopy (SEM) is indispensable for characterizing graphene layers. This review details SEM imaging of graphene layer, including the SEM image contrast mechanism of graphene layers, imaging parameter-dependent contrast of graphene layers and the influence of polycrystalline substrates on image contrast. Furthermore, a summary of SEM applications in imaging graphene layers is also provided, including layer-number determinations, study of chemical vapor deposition (CVD)-growth mechanism, and reveal of anti-corrosive failure mechanism of graphene layers. This review will provide a systematic and comprehensive understanding on SEM imaging of graphene layers for graphene community.
原子级厚度的石墨烯因其具有良好的电学、力学和热学性能,在探索基础科学和技术应用方面激发了人们极大的兴趣。深入了解石墨烯的几何/结构特征及其性质/性能非常重要。扫描电子显微镜(SEM)对于表征石墨烯层是必不可少的。本文综述详细介绍了石墨烯层的SEM成像,包括石墨烯层的SEM图像对比度机制、成像参数依赖的石墨烯层对比度以及多晶衬底对图像对比度的影响。此外,还总结了SEM在石墨烯层成像中的应用,包括层数测定、化学气相沉积(CVD)生长机制研究以及石墨烯层防腐失效机制的揭示。本文综述将为石墨烯领域的研究人员提供关于石墨烯层SEM成像的系统而全面的理解。