Guitard Laureen, Stolidi Adrien, Giakoumakis Georges, Sousa Martins Rafael, Primot Jérôme, Jarnac Amelie
Université Paris-Saclay, CEA, List, F-91120, Palaiseau, France.
DOTA, ONERA, Université Paris-Saclay, 91120, Palaiseau, France.
Sci Rep. 2024 Sep 18;14(1):21803. doi: 10.1038/s41598-024-72087-7.
Getting complementary physical information from a single image acquisition is particularly valuable for materials analysis. Grating based X-ray Phase Contrast Imaging (XPCI) methods allow decoupling attenuation, phase and scattering information. However, the phase and scattering extraction processes can easily suffer from artefacts, which is detrimental to implement this imaging technique in societal applications. In this paper, we demonstrate that grating based XPCI can provide a robust phase measurement in complex materials such as damaged composites. The technique allows the phase to be analysed using a self-assessment method that first identifies the artefacts from the imaging setup, and then can be used as an indicator to interpret the signal from a material. We focus on carbon fibre reinforced polymers which we subjected to laboratory-controlled lightning strikes. We evidence that the combined information from phase and attenuation allow identifying the type of defect induced by the lightning current. The phase information is converted into relative mass density variation within the sample and depicts areas with a loss in density up to 40%. We ensure that these results are valid by comparing them with an X-ray attenuation contrast tomographic reconstruction.
从单次图像采集获取互补的物理信息对于材料分析尤为重要。基于光栅的X射线相衬成像(XPCI)方法能够分离衰减、相位和散射信息。然而,相位和散射提取过程容易受到伪影的影响,这不利于在社会应用中实施这种成像技术。在本文中,我们证明基于光栅的XPCI能够在诸如受损复合材料等复杂材料中提供稳健的相位测量。该技术允许使用一种自我评估方法来分析相位,该方法首先从成像设置中识别伪影,然后可作为解释材料信号的指标。我们重点研究了在实验室控制的雷击条件下的碳纤维增强聚合物。我们证明,相位和衰减的综合信息能够识别由雷电流引起的缺陷类型。相位信息被转换为样品内的相对质量密度变化,并描绘出密度损失高达40%的区域。我们通过将这些结果与X射线衰减对比断层扫描重建结果进行比较,确保这些结果是有效的。