Membrane potential measurements of unfertilized and fertilized Xenopus laevis eggs are affected by damage caused by the electrode.

Upon penetration in an unfertilized Xenopus egg bathed in 1/10 Ringer, the voltage recorded by a microelectrode shows an abrupt jump to a negative voltage (Ep) followed by a rapid depolarization to a steady value (Er) (Ep = -39.4 +/- 1.9 mV and Er = -11.5 +/- 0.5 SE, 54 eggs from 9 females). The same is true for fertilized eggs impaled 16-35 min after insemination (Ep = -29.5 +/- 2.1 mV, Er = -11.5 +/- 0.9 mV, SE, 18 eggs from 3 females). The voltage recorded by a second microelectrode inserted into the same egg does not show the transient initial negativity. The stationary level of the membrane potential is close to the diffusion potential calculated from the Goldman equation with equal permeabilities for all the relevant ions. It is concluded that the low resting potentials measured in Xenopus eggs before and after fertilization are largely due to damage caused by the electrode. Using an upper limit of -39 mV for the true membrane potential and correlating the input resistance with the stationary membrane potential, a lower limit of 22 M omega (about 1 M omega cm2) for the membrane resistance can be obtained. Insertion of a microelectrode during the first 3 min after insemination shows a steady positive potential while, at later times (3-16 min post-insemination), a positive peak followed by a repolarization can be observed. This indicates that the measurement of the peak of the fertilization potential is not seriously affected by the electrode penetration while its time course after the first 3 min may be deformed by the presence of a large leakage conductance.