再结晶对钨扫描隧道显微镜针尖稳定性的影响。

Influence of recrystallization on stability of tungsten scanning tunneling microscope tips.

作者信息

Griffin R, Chandler H J, Rubanov S, Schenk A K, Pakes C I

机构信息

Department of Mathematical and Physical Sciences, School of Computing, Engineering and Mathematical Sciences, La Trobe University, Bundoora 3086, VIC, Australia.

Quantum Brilliance Pty. Ltd., 60 Mills Road, Acton 2601, ACT, Australia.

出版信息

Rev Sci Instrum. 2024 Oct 1;95(10). doi: 10.1063/5.0196497.

DOI:10.1063/5.0196497

PMID:39412352

Abstract

The structure and electron emission properties of scanning tunneling microscope tips electrochemically etched from polycrystalline and recrystallized tungsten wires were investigated using scanning electron microscopy and transmission electron microscopy. Tips etched using the recrystallized wire had single crystal domains larger than those seen in tips etched from the cold drawn wire. The stability of the tips under high electric fields was investigated using field emission. It was found that tips etched from the recrystallized wire tended to have improved stability compared to those etched from the polycrystalline wire and that annealing either type of tip to high temperature in ultra-high vacuum had the greater influence on tip stability.

摘要

利用扫描电子显微镜和透射电子显微镜研究了从多晶和再结晶钨丝电化学蚀刻的扫描隧道显微镜针尖的结构和电子发射特性。使用再结晶丝蚀刻的针尖具有比从冷拉丝蚀刻的针尖更大的单晶畴。使用场发射研究了针尖在高电场下的稳定性。结果发现，与从多晶丝蚀刻的针尖相比，从再结晶丝蚀刻的针尖往往具有更好的稳定性，并且在超高真空中将任何一种类型的针尖高温退火对针尖稳定性有更大影响。