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暴露于不同蚀刻方案下的氧化锆增强硅酸锂CAD/CAM陶瓷的机械、粘附和表面性能

Mechanical, Adhesive and Surface Properties of a Zirconia-Reinforced Lithium Silicate CAD/CAM Ceramic Exposed to Different Etching Protocols.

作者信息

Murillo-Gómez Fabián, Hernández-Víquez José Roberto, Sauma-Montes de Oca José Roberto, Vargas-Vargas Cristina, González-Vargas Natalia, Vega-Baudrit José Roberto, Chavarría-Bolaños Daniel

机构信息

Restorative Dentistry Department, School of Dentistry-FOd, University of Costa Rica-UCR, San José 11502, Costa Rica.

Dental Materials Research Laboratory (LIMD), School of Dentistry-FOd, University of Costa Rica-UCR, San José 11502, Costa Rica.

出版信息

Materials (Basel). 2024 Oct 15;17(20):5039. doi: 10.3390/ma17205039.

DOI:10.3390/ma17205039
PMID:39459744
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11509709/
Abstract

The aim of this investigation was to evaluate the effect of etching protocols on bond strength, surface roughness, and mechanical properties of a zirconia-reinforced lithium silicate (ZLS) CAD/CAM-ceramic. In total, 100 bars (ISO 6872), 75 plaques, and 25 cubes were cut from ZLS blocks(Vita Suprinity). The surfaces were standardized, crystallized and divided into five groups: 1. control (no/treatment-C), 2. 5%-Hydrofluoric-acid (HF)/20 s (HF5%20s), 3.HF5%60s, 4.HF10%20s, and 5.HF10%60s. Flexural strength (FS) (three-point bending test, 1 mm/min), roughness (Pa), and micro-shear bond-strength (µSBS) tests were performed. The data were statistically analyzed with one-way ANOVA, Tukey's test ( ˂ 0.05) and Weibull (FS data). C showed higher Pa (1.176 ± 0.370 µm) than HF10%60s (0.627 ± 0.236 µm) and all other groups. Groups C and 20 s showed the most irregular surface patterns. The FS results were not influenced by etching protocols, while the Weibull modulus was, with the 5%HF groups being the most reliable (m: 5.63/6.70), while C and HF10%60s (m: 2.78/2.73) were the least reliable. All fractures originated from surface defects on the treated side of specimens. The 5%HF groups showed higher µSBS (20 s: 21.35 ± 4.70 MPa; 60 s: 23.50 ± 4.27 MPa) than the 10%HF groups (20 s: 14.51 ± 2.47 MPa; 60 s: 16.54 ± 3.12 MPa) and C (6.46 ± 2.71 MPa). The most prevalent failure pattern was "mixed" for etched groups, and "adhesive" for C. Etching protocols affect the evaluated properties by roughening materials' surface and, in some cases, regularizing surface defects. The best overall outcomes were achieved when applying 5%HF.

摘要

本研究的目的是评估蚀刻方案对氧化锆增强硅酸锂(ZLS)CAD/CAM 陶瓷的粘结强度、表面粗糙度和机械性能的影响。总共从 ZLS 块体(维他超瓷)上切割出 100 根棒(ISO 6872)、75 个片和 25 个立方体。对这些表面进行标准化、晶化处理,并分为五组:1. 对照组(未处理 - C);2. 5%氢氟酸(HF)/20 秒(HF5%20s);3. HF5%60 秒;4. HF10%20 秒;5. HF10%60 秒。进行了弯曲强度(FS)(三点弯曲试验,1 毫米/分钟)、粗糙度(Pa)和微剪切粘结强度(µSBS)测试。数据采用单因素方差分析、Tukey 检验(˂ 0.05)和 Weibull 分析(FS 数据)进行统计学分析。C 组的 Pa 值(1.176 ± 0.370 µm)高于 HF10%60 秒组(0.627 ± 0.236 µm)及所有其他组。C 组和 20 秒处理组的表面图案最不规则。蚀刻方案对 FS 结果没有影响,但对 Weibull 模量有影响,5%HF 组最可靠(m:5.63/6.70),而 C 组和 HF10%60 秒组最不可靠(m:2.78/2.73)。所有断裂均起源于试样处理侧的表面缺陷。5%HF 组的 µSBS 高于 10%HF 组(20 秒:21.35 ± 4.70 MPa;60 秒:23.50 ± 4.2 MPa)和 C 组(6.46 ± 2.71 MPa)(20 秒:14.51 ± 2.47 MPa;60 秒:16.54 ± 3.12 MPa)。蚀刻组最常见的失效模式是“混合”模式,C 组是“粘结”模式。蚀刻方案通过使材料表面粗糙化并在某些情况下使表面缺陷规则化来影响所评估的性能。应用 5%HF 时总体效果最佳。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/fecaa49c69e1/materials-17-05039-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/31164d70b717/materials-17-05039-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/291fb542a0cf/materials-17-05039-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/aed43889faa6/materials-17-05039-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/077bed82821e/materials-17-05039-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/e80a34b228a2/materials-17-05039-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/f11ff0a561e2/materials-17-05039-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/fecaa49c69e1/materials-17-05039-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/31164d70b717/materials-17-05039-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/291fb542a0cf/materials-17-05039-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/aed43889faa6/materials-17-05039-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/077bed82821e/materials-17-05039-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/e80a34b228a2/materials-17-05039-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/f11ff0a561e2/materials-17-05039-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7304/11509709/fecaa49c69e1/materials-17-05039-g007.jpg

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