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光频软化而无退极化,源于原子间键合强度降低。

Softening of the optical phonon by reduced interatomic bonding strength without depolarization.

机构信息

State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China.

Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China.

出版信息

Nature. 2024 Oct;634(8036):1080-1085. doi: 10.1038/s41586-024-08099-0. Epub 2024 Oct 30.

Abstract

Softening of the transverse optical (TO) phonon, which could trigger ferroelectric phase transition, can usually be achieved by enhancing the long-range Coulomb interaction over the short-range bonding force, for example, by increasing the Born effective charges. However, it suffers from depolarization effects as the induced ferroelectricity is suppressed on size reduction of the host materials towards high-density nanoscale electronics. Here, we present an alternative route to drive the TO phonon softening by showing that the abnormal soft TO phonon in rocksalt-structured ultrawide-bandgap BeO (ref. ) is mainly induced by a substantial reduction in the short-range bonding interaction due to the Be-O bond stretching caused by an electron cloud-overlap-induced Coulomb repulsion between two adjacent oxygen ions that are arranged octahedrally around an extremely small Be ion. We further demonstrate the emergence of robust ferroelectricity in strain-induced perovskite BaZrO and ultrathin HfO and ZrO films grown epitaxially on lattice-mismatched SiO/Si substrate arising from the softening of the TO phonon driven by a reduction in the short-range bonding strength of biaxial strain-induced stretching bonds. These findings shed light on developing a unified theory for ferroelectricity enhancement in ultrathin films free from depolarization fields by tailoring chemical bonds using ionic radius differences, strains, doping and lattice distortions.

摘要

横光学(TO)声子软化通常可以通过增强长程库仑相互作用超过短程键力来实现,例如,通过增加 Born 有效电荷。然而,随着宿主材料向高密度纳米尺度电子学的尺寸减小,诱导铁电性受到去极化效应的抑制,因此这种方法受到限制。在这里,我们通过展示岩盐结构的超宽带隙 BeO(参考文献)中异常软的 TO 声子主要是由于相邻氧离子之间的电子云重叠引起的库仑斥力导致 Be-O 键拉伸,从而导致短程键相互作用大大降低,从而提供了一种驱动 TO 声子软化的替代途径,这些氧离子呈八面体排列在非常小的 Be 离子周围。我们进一步证明,在晶格失配的 SiO/Si 衬底上外延生长的应变诱导钙钛矿 BaZrO 和超薄 HfO 和 ZrO 薄膜中出现了稳定的铁电性,这是由于双轴应变诱导拉伸键的短程键强度降低导致 TO 声子软化所致。这些发现为通过利用离子半径差、应变、掺杂和晶格畸变来调整化学键,在没有去极化场的情况下开发超薄薄膜中铁电性增强的统一理论提供了思路。

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