Balaban R S, Kurtz I, Cascio H E, Smith P D
J Microsc. 1986 Jan;141(Pt 1):31-9. doi: 10.1111/j.1365-2818.1986.tb02698.x.
A technique is described which permits the simultaneous acquisition of multiple fluorescent emission and/or absorption spectra from discrete regions of a specimen under microscopic observation. The instrument consists of a modified inverted microscope, an optical diffraction grating, a silicon intensified target (SIT) camera, and a digital video image processor. Observation of the zero diffraction order of the grating with the SIT camera permits an optical slice of the specimen to be selected by positioning the region of interest over the entrance slit of the grating housing. To obtain the spectral characteristics of this optical slice, the grating is rotated to impinge the first order diffraction on the camera. The video image of this first order diffraction maintains spatial integrity along the slit's long axis and provides spectral dispersion on the perpendicular axis. Thus, each of the horizontal video lines along the long axis of the slit represents a spectral analysis of the corresponding spatial location within the specimen. The spectral resolution (0.2 nm/channel) of each video line is determined by the resolution of the camera system in conjunction with the resolution of the grating. The image processing system acquires and processes all 500 spectra in 33 ms and permits the accurate localization of the source of each spectrum in the slice. This type of topological spectral analysis permits the determination of both spatial and spectral characteristics of intrinsic or extrinsic chromophores within the specimen. In addition, this technique permits the detection of and the possible correction for photobleaching, light scattering and image plane effects.(ABSTRACT TRUNCATED AT 250 WORDS)
本文描述了一种技术,该技术可在显微镜观察下从标本的离散区域同时获取多个荧光发射光谱和/或吸收光谱。该仪器由一台改良的倒置显微镜、一个光学衍射光栅、一个硅增强靶(SIT)相机和一个数字视频图像处理器组成。用SIT相机观察光栅的零级衍射,通过将感兴趣区域定位在光栅外壳的入口狭缝上方,可以选择标本的一个光学切片。为了获得该光学切片的光谱特性,旋转光栅使一级衍射投射到相机上。该一级衍射的视频图像沿狭缝的长轴保持空间完整性,并在垂直轴上提供光谱色散。因此,沿着狭缝长轴的每条水平视频线代表标本内相应空间位置的光谱分析。每条视频线的光谱分辨率(0.2纳米/通道)由相机系统的分辨率与光栅的分辨率共同决定。图像处理系统在33毫秒内采集并处理所有500个光谱,并能准确确定切片中每个光谱源的位置。这种拓扑光谱分析可以确定标本内固有或外在发色团的空间和光谱特性。此外,该技术还能检测光漂白、光散射和图像平面效应,并可能对其进行校正。(摘要截选于250词)