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基于MoS/SbTe异质结的自供电宽带光电探测器:一种用于高灵敏度检测的有前景的方法。

Self-powered broadband photodetector based on MoS/SbTe heterojunctions: a promising approach for highly sensitive detection.

作者信息

Wang Hao, Gui Yaliang, Dong Chaobo, Altaleb Salem, Nouri Behrouz Movahhed, Thomaschewski Martin, Dalir Hamed, Sorger Volker J

机构信息

Department of Electrical & Computer Engineering, The George Washington University, 800 22nd Street NW 5000 Science & Engineering Hall, Washington, DC 20052, USA.

Optelligence LLC, 10703 Marlboro Pike, Upper Marlboro, MD 20772, USA.

出版信息

Nanophotonics. 2022 Oct 28;11(22):5113-5119. doi: 10.1515/nanoph-2022-0413. eCollection 2022 Dec.

Abstract

Topological insulators have shown great potential for future optoelectronic technology due to their extraordinary optical and electrical properties. Photodetectors, as one of the most widely used optoelectronic devices, are crucial for sensing, imaging, communication, and optical computing systems to convert optical signals to electrical signals. Here we experimentally show a novel combination of topological insulators (TIs) and transition metal chalcogenides (TMDs) based self-powered photodetectors with ultra-low dark current and high sensitivity. The photodetector formed by a MoS/SbTe heterogeneous junction exhibits a low dark current of 2.4 pA at zero bias and 1.2 nA at 1V. It shows a high photoresponsivity of >150 mA W at zero bias and rectification of 3 times at an externally applied bias voltage of 1V. The excellent performance of the proposed photodetector with its innovative material combination of TMDs and TIs paves the way for the development of novel high-performance optoelectronic devices. The TIs/TMDs transfer used to form the heterojunction is simple to incorporate into on-chip waveguide systems, enabling future applications on highly integrated photonic circuits.

摘要

拓扑绝缘体因其非凡的光学和电学特性,在未来的光电子技术中展现出了巨大潜力。光电探测器作为应用最为广泛的光电器件之一,对于传感、成像、通信以及将光信号转换为电信号的光学计算系统而言至关重要。在此,我们通过实验展示了一种基于拓扑绝缘体(TIs)和过渡金属硫族化合物(TMDs)的新型自供电光电探测器,该探测器具有超低暗电流和高灵敏度。由MoS/SbTe异质结形成的光电探测器在零偏压下呈现出2.4 pA的低暗电流,在1V时为1.2 nA。它在零偏压下具有大于150 mA W的高光响应度,在1V的外部施加偏压下具有3倍的整流比。所提出的光电探测器凭借TMDs和TIs的创新材料组合所展现出的优异性能,为新型高性能光电器件的发展铺平了道路。用于形成异质结的TIs/TMDs转移易于集成到片上波导系统中,从而为未来在高度集成光子电路中的应用创造了条件。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f679/11502055/ffdcb91c9096/j_nanoph-2022-0413_fig_001.jpg

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