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由于富勒烯的各向异性变形和内嵌团簇的棱锥化导致的LuN@C从n型到p型的导电性转变

n- to p-Type Conductivity Transition of LuN@C Due to Anisotropic Deformation of Fullerene and Pyramidalization of Endohedral Clusters.

作者信息

Pei Cuiying, Sundqvist Bertil, Yao Zhen, Yan Zhipeng, Liu Guangtao, Samanta Sudeshna, Xiao Hong, Wang Yaofeng, Qi Yanpeng, Chen Ning, Wang Lin, Tian Yongjun

机构信息

Center for High Pressure Science (CHiPS), State Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao, Hebei 066004, China.

School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China.

出版信息

Nano Lett. 2024 Dec 18;24(50):16099-16105. doi: 10.1021/acs.nanolett.4c04824. Epub 2024 Dec 6.

Abstract

The endohedral fullerene LuN@C was examined using in situ high-pressure measurements, which included electrical transport, Fourier-transform infrared spectroscopy, and Raman spectroscopy, in combination with theoretical calculations. LuN@C was found to undergo a reversible n- to p-type conversion at ∼8.9 GPa. This p-type semiconductor remains stable up to 25 GPa. The fullerene cage collapses at ∼29 GPa, resulting in an irreversible p- to n-type conversion. Raman, infrared, and X-ray absorption spectroscopy reveal that an anisotropic distortion of the carbon cage and a pyramidalization of the planar LuN clusters occur during compression. Density functional theory simulations indicate that the p orbitals of C atoms in the fullerene cage primarily contribute to the density of states (DOS). Pressure-induced deformation of the fullerene cage dominates the DOS changes in the conduction and valence bands close to the Fermi level. The findings elucidate the relationship between the conductivity and structural changes in the endohedral clusters.

摘要

使用原位高压测量方法对内嵌富勒烯LuN@C进行了研究,该方法包括电输运、傅里叶变换红外光谱和拉曼光谱,并结合了理论计算。发现LuN@C在约8.9 GPa时会发生从n型到p型的可逆转变。这种p型半导体在高达25 GPa时仍保持稳定。富勒烯笼在约29 GPa时坍塌,导致从p型到n型的不可逆转变。拉曼光谱、红外光谱和X射线吸收光谱表明,在压缩过程中碳笼发生了各向异性畸变,平面LuN簇发生了锥化。密度泛函理论模拟表明,富勒烯笼中C原子的p轨道对态密度(DOS)起主要作用。压力诱导的富勒烯笼变形主导了靠近费米能级的导带和价带中的DOS变化。这些发现阐明了内嵌簇中电导率与结构变化之间的关系。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ac7a/12349245/8537fde70336/nl4c04824_0001.jpg

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