利用常压X射线光电子能谱对金红石型TiO(110)/0.1 M HCl界面的电化学进行原位表征。
Operando Characterization of Electrochemistry at the Rutile TiO(110)/0.1 M HCl Interface Using Ambient Pressure XPS.
作者信息
Yu Jiangdong, Byrne Conor, Imran Jameel, Henderson Zoë, Holt Katherine B, Large Alexander I, Held Georg, Walton Alex, Thornton Geoff
机构信息
London Centre for Nanotechnology and Chemistry Department, University College London, 20 Gordon Street, London WC1H 0AJ, U.K.
Department of Chemistry, University of Manchester, Manchester M13 9PL, U.K.
出版信息
J Phys Chem C Nanomater Interfaces. 2024 Nov 26;128(49):20933-20939. doi: 10.1021/acs.jpcc.4c07173. eCollection 2024 Dec 12.
Ambient pressure X-ray photoelectron spectroscopy (AP-XPS) was employed to investigate the effect of applied potential on the interface of TiO(110) with 0.1 M HCl. The study, which involved operando electrochemical characterization, enabled real-time monitoring and analysis of electrochemical processes. There is a significant influence on the interface composition; in particular, the surface Cl surface coverage varies with electrochemical potential. Moreover, there appears to be a reaction of evolved Cl with adventitious carbon to form C-Cl and C-Cl species.
采用环境压力X射线光电子能谱（AP-XPS）研究了外加电势对TiO(110)与0.1 M HCl界面的影响。该研究涉及原位电化学表征，能够对电化学过程进行实时监测和分析。外加电势对界面组成有显著影响；特别是，表面Cl的表面覆盖度随电化学电势而变化。此外，析出的Cl似乎与不定型碳发生反应，形成C-Cl和C-Cl物种。
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