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钻石光源多功能软X射线(VersoX)光束线的常压终端站。

Ambient-pressure endstation of the Versatile Soft X-ray (VerSoX) beamline at Diamond Light Source.

作者信息

Held Georg, Venturini Federica, Grinter David C, Ferrer Pilar, Arrigo Rosa, Deacon Liam, Quevedo Garzon Wilson, Roy Kanak, Large Alex, Stephens Christopher, Watts Andrew, Larkin Paul, Hand Matthew, Wang Hongchang, Pratt Linda, Mudd James J, Richardson Thomas, Patel Suren, Hillman Michael, Scott Stewart

机构信息

Diamond Light Source Ltd, Oxfordshire, United Kingdom.

Department of Chemistry, University of Reading, Reading, United Kingdom.

出版信息

J Synchrotron Radiat. 2020 Sep 1;27(Pt 5):1153-1166. doi: 10.1107/S1600577520009157. Epub 2020 Aug 17.

Abstract

The ambient-pressure endstation and branchline of the Versatile Soft X-ray (VerSoX) beamline B07 at Diamond Light Source serves a very diverse user community studying heterogeneous catalysts, pharmaceuticals and biomaterials under realistic conditions, liquids and ices, and novel electronic, photonic and battery materials. The instrument facilitates studies of the near-surface chemical composition, electronic and geometric structure of a variety of samples using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy in the photon energy range from 170 eV to 2800 eV. The beamline provides a resolving power hν/Δ(hν) > 5000 at a photon flux > 10 photons s over most of its energy range. By operating the optical elements in a low-pressure oxygen atmosphere, carbon contamination can be almost completely eliminated, which makes the beamline particularly suitable for carbon K-edge NEXAFS. The endstation can be operated at pressures up to 100 mbar, whereby XPS can be routinely performed up to 30 mbar. A selection of typical data demonstrates the capability of the instrument to analyse details of the surface composition of solid samples under ambient-pressure conditions using XPS and NEXAFS. In addition, it offers a convenient way of analysing the gas phase through X-ray absorption spectroscopy. Short XPS spectra can be measured at a time scale of tens of seconds. The shortest data acquisition times for NEXAFS are around 0.5 s per data point.

摘要

位于英国钻石光源(Diamond Light Source)的通用软X射线(Versatile Soft X-ray,VerSoX)光束线B07的常压终端站和支线,服务于非常多样化的用户群体,他们在实际条件下研究非均相催化剂、药物和生物材料、液体和冰,以及新型电子、光子和电池材料。该仪器利用X射线光电子能谱(XPS)和近边X射线吸收精细结构(NEXAFS)光谱,在170 eV至2800 eV的光子能量范围内,对各种样品的近表面化学成分、电子和几何结构进行研究。在其大部分能量范围内,该光束线在光子通量>10 photons s时,提供的分辨能力hν/Δ(hν)>5000。通过在低压氧气气氛中操作光学元件,几乎可以完全消除碳污染,这使得该光束线特别适合于碳K边NEXAFS。终端站可在高达100 mbar的压力下运行,因此XPS可常规在高达30 mbar的压力下进行。一系列典型数据展示了该仪器在常压条件下使用XPS和NEXAFS分析固体样品表面组成细节的能力。此外,它还提供了一种通过X射线吸收光谱分析气相的便捷方法。短时间的XPS光谱可以在几十秒的时间尺度内测量。NEXAFS的最短数据采集时间约为每个数据点0.5 s。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1c3d/7467337/f6063f167090/s-27-01153-fig1.jpg

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