Dunlap Megan K, Kringle Loni, Kay Bruce D, Kimmel Greg A
Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99352, USA.
J Chem Phys. 2024 Dec 28;161(24). doi: 10.1063/5.0233755.
The reaction coefficient for hydrogen/deuterium (H/D) exchange and the diffusion of hydrated excess protons within amorphous solid water (ASW) are characterized as a function of temperature. For these experiments, water films are deposited on a Pt(111) substrate at 108 K, and reactions with pre-adsorbed hydrogen atoms produce hydrated protons. Upon heating, protons diffuse within the water, and H/D exchange occurs when they encounter D2O probe molecules deposited in the films. The time-dependent concentration of D2O is monitored with infrared spectroscopy, and it indicates the protons diffusion from the substrate and establish an equilibrium distribution prior to significant H/D exchange for temperatures 114 K ≤T≤ 134 K. By controlling the distance between the D2O molecules and the substrate, we probe the distribution of protons within the film. It decays as x-2 for the examined range of x (12-52 nm) due to the electric field that develops between the diffusing protons and their image charges in the metal substrate. This agrees with the theoretical distance scaling for the equilibrated proton concentration in a dielectric near a metal boundary. From the proton concentration and the measured D2O decay rate, a lower bound for the proton diffusion coefficient ranging from 10-20 m2/s at 114 K to 10-18 m2/s at 134 K is estimated. The diffusion coefficient has an activation energy of 0.40 eV, which is comparable to energies reported for molecular translations and rotations of H2O, suggesting they may play a critical role in the proton diffusion mechanism within ASW.
氢/氘(H/D)交换的反应系数以及水合过量质子在非晶态固体水(ASW)中的扩散被表征为温度的函数。对于这些实验,水膜在108K下沉积在Pt(111)衬底上,与预吸附的氢原子反应产生水合质子。加热时,质子在水中扩散,当它们遇到沉积在膜中的D2O探针分子时发生H/D交换。用红外光谱监测D2O随时间变化的浓度,这表明质子从衬底扩散,并在114K≤T≤134K的温度下在显著的H/D交换之前建立平衡分布。通过控制D2O分子与衬底之间的距离,我们探测膜内质子的分布。在所研究的x范围(12 - 52nm)内,由于扩散质子与其在金属衬底中的镜像电荷之间产生的电场,其以x - 2衰减。这与金属边界附近电介质中平衡质子浓度的理论距离标度一致。根据质子浓度和测得的D2O衰减率,估计质子扩散系数的下限在114K时为10 - 20m2/s,在134K时为10 - 18m2/s。扩散系数的活化能为0.40eV,这与报道的H2O分子平移和旋转的能量相当,表明它们可能在ASW内的质子扩散机制中起关键作用。