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具有高载流子迁移率的新型负泊松比半导体:Janus GeXY(X/Y = S、Se、Te)单层的第一性原理预测

Novel auxetic semiconductors with high carrier mobility: first principles prediction of Janus GeXY (X/Y = S, Se, Te) monolayers.

作者信息

Nha Vo Q, San Nguyen Q, Linh Huynh T T, Vu Tuan V, Hien Nguyen D

机构信息

School of Engineering and Technology, Hue University Hue Vietnam.

Laboratory for Computational Physics, Institute for Computational Science and Artificial Intelligence, Van Lang University Ho Chi Minh City Vietnam

出版信息

Nanoscale Adv. 2025 Feb 21;7(8):2301-2308. doi: 10.1039/d4na00852a. eCollection 2025 Apr 8.

Abstract

Recently, auxetic materials have attracted attention due to their unusual behavior and multifunctional applications. A negative Poisson's ratio has been found in some two-dimensional (2D) asymmetric layered materials. In this work, we predict a new class of 2D auxetic materials with the chemical formula GeXY (X/Y = S, Se, Te) using calculations. We construct the crystal structure and evaluate the stability of Janus GeXY monolayers under ambient conditions. Phonon dispersion spectra, cohesive energy calculations, and molecular dynamics simulations confirm the high structural stability of GeXY. At the ground state, GeXY monolayers are semiconductors with narrow band gaps ranging from 0.11 to 1.09 eV. We also calculate the mechanical properties, including elastic constants, Young's modulus, and Poisson's ratio. Importantly, the GeXY monolayers represent ideal auxetic materials with a large negative Poisson's ratio. All three GeXY systems possess Poisson's ratio values of around -0.2 along the -axis. Moreover, GeXY monolayers are predicted to have high electron mobility up to 10.92 × 10 cm V s (GeSTe). The combination of ideal auxetic behavior and tunable transport properties makes the Janus GeXY structures promising materials for nanoelectronic and mechanical applications.

摘要

最近,负泊松比材料因其异常行为和多功能应用而备受关注。在一些二维(2D)不对称层状材料中发现了负泊松比。在这项工作中,我们通过计算预测了一类化学式为GeXY(X/Y = S、Se、Te)的新型二维负泊松比材料。我们构建了晶体结构并评估了在环境条件下Janus GeXY单层的稳定性。声子色散谱、结合能计算和分子动力学模拟证实了GeXY的高结构稳定性。在基态下,GeXY单层是具有0.11至1.09 eV窄带隙的半导体。我们还计算了机械性能,包括弹性常数、杨氏模量和泊松比。重要的是,GeXY单层代表了具有大负泊松比的理想负泊松比材料。所有三种GeXY体系沿轴的泊松比值约为 -0.2。此外,预测GeXY单层具有高达10.92×10 cm² V⁻¹ s⁻¹(GeSTe)的高电子迁移率。理想的负泊松比行为和可调传输特性的结合使Janus GeXY结构成为纳米电子和机械应用的有前途的材料。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6086/11977325/4949e80f2ca4/d4na00852a-f1.jpg

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