• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

热迁移过程中化学镀Ni-P/Sn2.5Ag0.7Cu0.1RE微焊点的微观结构与性能

Microstructure and properties of electroless Ni-P/Sn2.5Ag0.7Cu0.1RE micro-joints during thermomigration.

作者信息

Hou Ruiqing, Zhang Keke, Zhao Wenjia, Zhang Haizhou, Zhang Chao, Wang Yonglei

机构信息

School of Materials Science and Engineering, Henan University of Science and Technology, Luoyang, 471000, China.

Key Laboratory of Nonferrous Metals Science and Processing Technology in Henan Province, Luoyang, 471000, China.

出版信息

Sci Rep. 2025 Mar 11;15(1):8420. doi: 10.1038/s41598-025-89492-1.

DOI:10.1038/s41598-025-89492-1
PMID:40069336
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11897412/
Abstract

The Ni-P stratum was fabricated upon the Cu substrate via an electroless plating technique, and the microstructure and properties of electroless Ni-P/Sn2.5Ag0.7Cu0.1RE micro-joints under temperature gradient was studied. Research indicates that in the initial stage of thermomigration in micro-solder joints, the intermetallic compound (IMC) in the Ni-P/soldering seam transition area appears as both "needle-shaped" and "block-shaped" (Ni, Cu)Sn, with an average thickness of 1.1-1.5 μm. Additionally, between Cu and (Ni, Cu)Sn IMC, there exists a 0.8 μm thick "layered" NiP within the Ni-P layer. The temperature gradient causes the asymmetric growth of (Ni, Cu)Sn IMC and the asymmetric evolution of the Ni-P layer at the hot and cold ends of the micro-solder joint. The Ni-P layer evolution is divided into two stages: Ni-P → NiP + Ni and NiP + Sn → Ni-Sn-P, and the cold end structure evolves faster than the hot end. After 60 h under the temperature gradient condition of 550 °C/cm, the shear fracture position of the micro-solder joint shifts from the soldering seam to the Ni-Sn-P/IMC layer junction, and fracture mode changes from ductile fracture dominated by dimples to brittle fracture dominated by cleavage and slip steps, corresponding to a decrease of 21.8% in micro-solder joint pushing shear force from 16N.

摘要

通过化学镀技术在铜基板上制备了Ni-P镀层,并研究了化学镀Ni-P/Sn2.5Ag0.7Cu0.1RE微焊点在温度梯度下的微观结构和性能。研究表明,在微焊点热迁移的初始阶段,Ni-P/焊缝过渡区的金属间化合物(IMC)呈现为“针状”和“块状”(Ni, Cu)Sn,平均厚度为1.1-1.5μm。此外,在Cu与(Ni, Cu)Sn IMC之间,Ni-P层内存在一层厚度为0.8μm的“层状”NiP。温度梯度导致微焊点热端和冷端的(Ni, Cu)Sn IMC不对称生长以及Ni-P层不对称演变。Ni-P层的演变分为两个阶段:Ni-P→NiP+Ni和NiP+Sn→Ni-Sn-P,且冷端结构的演变比热端快。在550°C/cm的温度梯度条件下60小时后,微焊点的剪切断裂位置从焊缝转移到Ni-Sn-P/IMC层交界处,断裂模式从以韧窝为主的韧性断裂转变为以解理和滑移台阶为主的脆性断裂,对应微焊点推剪力从16N下降了21.8%。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/4eeea65c8ada/41598_2025_89492_Fig15_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/45c32daeb566/41598_2025_89492_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/231b13a29283/41598_2025_89492_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/31e8a6c2c9b9/41598_2025_89492_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/439efe69e46d/41598_2025_89492_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/90bb6b281ed2/41598_2025_89492_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/7e1e99f2f6bd/41598_2025_89492_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/4fb637cfaed0/41598_2025_89492_Fig7_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/0247836adfef/41598_2025_89492_Fig8_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/c18daca38fec/41598_2025_89492_Fig9_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/3010ddbd46dc/41598_2025_89492_Fig10_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/097314b4e1c6/41598_2025_89492_Fig11_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/b02ff95eb89b/41598_2025_89492_Fig12_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/36a26b87c723/41598_2025_89492_Fig13_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/17b8d040636c/41598_2025_89492_Fig14_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/4eeea65c8ada/41598_2025_89492_Fig15_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/45c32daeb566/41598_2025_89492_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/231b13a29283/41598_2025_89492_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/31e8a6c2c9b9/41598_2025_89492_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/439efe69e46d/41598_2025_89492_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/90bb6b281ed2/41598_2025_89492_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/7e1e99f2f6bd/41598_2025_89492_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/4fb637cfaed0/41598_2025_89492_Fig7_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/0247836adfef/41598_2025_89492_Fig8_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/c18daca38fec/41598_2025_89492_Fig9_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/3010ddbd46dc/41598_2025_89492_Fig10_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/097314b4e1c6/41598_2025_89492_Fig11_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/b02ff95eb89b/41598_2025_89492_Fig12_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/36a26b87c723/41598_2025_89492_Fig13_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/17b8d040636c/41598_2025_89492_Fig14_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fbad/11897412/4eeea65c8ada/41598_2025_89492_Fig15_HTML.jpg

相似文献

1
Microstructure and properties of electroless Ni-P/Sn2.5Ag0.7Cu0.1RE micro-joints during thermomigration.热迁移过程中化学镀Ni-P/Sn2.5Ag0.7Cu0.1RE微焊点的微观结构与性能
Sci Rep. 2025 Mar 11;15(1):8420. doi: 10.1038/s41598-025-89492-1.
2
Microstructure and shear properties of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints under thermal cycling.热循环下超声辅助Sn2.5Ag0.7Cu0.1RExNi/Cu焊点的微观结构与剪切性能
Sci Rep. 2021 Mar 18;11(1):6297. doi: 10.1038/s41598-021-85685-6.
3
Dynamic Observation of Interfacial IMC Evolution and Fracture Mechanism of Sn2.5Ag0.7Cu0.1RE/Cu Lead-Free Solder Joints during Isothermal Aging.Sn2.5Ag0.7Cu0.1RE/Cu无铅焊点在等温时效过程中界面金属间化合物演变及断裂机制的动态观察
Materials (Basel). 2020 Feb 12;13(4):831. doi: 10.3390/ma13040831.
4
Study on Microstructure and Mechanical Properties at Constant Electromigration Temperature of Sn2.5Ag0.7Cu0.1RE0.05Ni-GNSs/Cu Solder Joints.Sn2.5Ag0.7Cu0.1RE0.05Ni-石墨烯纳米片/铜焊点在恒定电迁移温度下的微观结构与力学性能研究
Materials (Basel). 2023 Mar 26;16(7):2626. doi: 10.3390/ma16072626.
5
Ultrasonic soldering of Cu alloy using Ni-foam/Sn composite interlayer.使用泡沫镍/Sn 复合中间层的 Cu 合金超声钎焊。
Ultrason Sonochem. 2018 Jul;45:223-230. doi: 10.1016/j.ultsonch.2018.03.005. Epub 2018 Mar 16.
6
Solid-phase transient soldering method based on Au/Ni-W multilayer thin-film-modified copper-based structures.基于金/镍钨多层薄膜改性铜基结构的固相瞬态焊接方法
Heliyon. 2024 Jun 13;10(12):e33071. doi: 10.1016/j.heliyon.2024.e33071. eCollection 2024 Jun 30.
7
Effect of Isothermal Annealing on Sn Whisker Growth Behavior of Sn0.7Cu0.05Ni Solder Joint.等温退火对Sn0.7Cu0.05Ni焊点锡须生长行为的影响
Materials (Basel). 2023 Feb 24;16(5):1852. doi: 10.3390/ma16051852.
8
Diffusion Barrier Performance of Ni-W Layer at Sn/Cu Interfacial Reaction.Ni-W层在Sn/Cu界面反应中的扩散阻挡性能
Materials (Basel). 2024 Jul 25;17(15):3682. doi: 10.3390/ma17153682.
9
Microstructure evolution and grain refinement of ultrasonic-assisted soldering joint by using Ni foam reinforced Sn composite solder.采用泡沫镍增强 Sn 复合材料钎料的超声辅助钎焊接头的微观组织演变和晶粒细化。
Ultrason Sonochem. 2023 Jan;92:106244. doi: 10.1016/j.ultsonch.2022.106244. Epub 2022 Dec 2.
10
Brittle Fracture Behavior of Sn-Ag-Cu Solder Joints with Ni-Less Surface Finish via Laser-Assisted Bonding.通过激光辅助键合的无镍表面处理的Sn-Ag-Cu焊点的脆性断裂行为
Materials (Basel). 2024 Jul 22;17(14):3619. doi: 10.3390/ma17143619.

本文引用的文献

1
A new failure mechanism of electromigration by surface diffusion of Sn on Ni and Cu metallization in microbumps.微凸点中Sn在Ni和Cu金属化层上表面扩散导致的电迁移新失效机制。
Sci Rep. 2018 Apr 12;8(1):5935. doi: 10.1038/s41598-018-23809-1.