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用于脑部镁测量的基于互补金属氧化物半导体的植入式多离子图像传感器。

CMOS-Based Implantable Multi-Ion Image Sensor for Mg Measurement in the Brain.

作者信息

Nakamura Yuto, Doi Hideo, Kimura Yasuyuki, Horio Tomoko, Choi Yong-Joon, Takahashi Kazuhiro, Noda Toshihiko, Sawada Kazuaki

机构信息

Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Toyohashi 441-8122, Aichi, Japan.

出版信息

Sensors (Basel). 2025 Apr 20;25(8):2595. doi: 10.3390/s25082595.

Abstract

An implantable multi-ion image sensor equipped with magnesium ion (Mg)-and calcium ion (Ca)-sensitive membranes was fabricated for the selective measurement of extracellular Mg in the brain, and the sensor performance was evaluated. This sensor complements the low selectivity of the Mg-sensitive membrane for Ca by depositing a Ca-sensitive membrane in addition to the Mg-sensitive membrane on a CMOS (Complementary Metal Oxide Semiconductor)-based potentiometric sensor array with 5.65 × 4.39 µm pitch, enabling selective measurement of Mg and Ca. Characterization of the sensor confirmed a Ca sensitivity of 26.5 mV/dec and Mg sensitivity of 19 mV/dec. Based on validation experiments with varying concentrations of Mg and Ca, selective Ca and Mg measurements were successfully achieved. Furthermore, real-time imaging of Mg and Ca and quantification of their concentration changes were performed. The developed sensor may be successfully applied for extracellular multi-ion imaging of Mg and Ca in the living brain.

摘要

制备了一种配备镁离子(Mg)和钙离子(Ca)敏感膜的可植入多离子图像传感器,用于选择性测量大脑中的细胞外镁,并且对该传感器的性能进行了评估。该传感器通过在基于互补金属氧化物半导体(CMOS)的电位传感器阵列(间距为5.65×4.39 µm)上除了镁敏感膜之外还沉积一层钙敏感膜,弥补了镁敏感膜对钙的低选择性,从而能够对镁和钙进行选择性测量。传感器的表征证实其对钙的灵敏度为26.5 mV/dec,对镁的灵敏度为19 mV/dec。基于不同浓度的镁和钙的验证实验,成功实现了对钙和镁的选择性测量。此外,还进行了镁和钙的实时成像以及它们浓度变化的定量分析。所开发的传感器可能成功应用于活体大脑中镁和钙的细胞外多离子成像。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a920/12031582/8b4b099c5c07/sensors-25-02595-g001.jpg

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