Kuroda Yukiko, Nagai Koki, Kawai Yasuhiro, Naruto Takuya, Saijou Harutaka, Morikawa Shotaro, Goto Tomohide, Sato Mutsumi, Kurosawa Kenji
Division of Medical Genetics, Kanagawa Children's Medical Center, Yokohama, Japan
Division of Medical Genetics, Kanagawa Children's Medical Center, Yokohama, Japan.
J Med Genet. 2025 Jul 21;62(8):531-535. doi: 10.1136/jmg-2024-110604.
encodes U4 small nuclear RNA (snRNA), a non-coding RNA forming the spliceosome complex via the U4/U6 snRNA duplex. heterozygous variants cause ReNU syndrome, which is characterised by intellectual disability, developmental delay, epilepsy, short stature and distinctive dysmorphic features. ReNU syndrome accounts for 0.4-0.5% of all cases of developmental delay, and variants are located in the T-loop or stem III region of U4 snRNA, of which approximately 80% are the n.64_65insT variant in the T-loop. We identified four Japanese patients (4.3%) with novel and recurrent variants from 93 individuals of developmental delay with negative results from exome sequencing. Genotype-phenotype correlations were observed in the present case series and a literature review. T-loop variants manifested severe developmental delay with more than 70% of cases being non-verbal. Stem III region variants resulted in milder developmental delay with fluent speech and nearly normal gross motor development milestones. In addition, we report a patient demonstrating intractable epilepsy with neurological regression harbouring a novel de novo heterozygous variant (n.66A>G). This report expands the phenotypic spectrum of ReNU syndrome and suggests the presence of phenotypic variability related to variant location.
编码U4小核RNA(snRNA),一种通过U4/U6 snRNA双链体形成剪接体复合物的非编码RNA。杂合变异导致ReNU综合征,其特征为智力残疾、发育迟缓、癫痫、身材矮小和独特的畸形特征。ReNU综合征占所有发育迟缓病例的0.4-0.5%,变异位于U4 snRNA的T环或茎III区域,其中约80%是T环中的n.64_65insT变异。我们从93例发育迟缓个体中鉴定出4例日本患者(4.3%)携带新的复发性变异,外显子组测序结果为阴性。在本病例系列和文献综述中观察到基因型-表型相关性。T环变异表现为严重发育迟缓,超过70%的病例无语言能力。茎III区域变异导致较轻的发育迟缓,语言流畅,粗大运动发育里程碑几乎正常。此外,我们报告了1例患有顽固性癫痫伴神经功能衰退的患者,携带一种新的新生杂合变异(n.66A>G)。本报告扩展了ReNU综合征的表型谱,并提示存在与变异位置相关的表型变异性。