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平面铁电铌氧化物中本征及LED光增强忆阻器性能的观察

Observation of Intrinsic and LED Light-Enhanced Memristor Performance in In-Plane Ferroelectric NbOI.

作者信息

Hao Zheng, Zhao Gaolei, Liu Juhe, Tong Yunhao, Li Haoran, Zhang Jichang, Liu Jiabin, Kong Fanyi, Kozadaev Konstantin V, Li Yongjiang, Han Xue, Li Hong, Huang Huolin, Sun Changsen, Tolstik Alexei, Novitsky Andrey, Pan Lujun, Li Dawei

机构信息

School of Optoelectronic Engineering and Instrumentation Science, Dalian University of Technology, Dalian, Liaoning 116024, China.

Dalian University of Technology and Belarusian State University Joint Institute, Dalian University of Technology, Dalian, Liaoning 116024, China.

出版信息

ACS Nano. 2025 Aug 5;19(30):27654-27664. doi: 10.1021/acsnano.5c07236. Epub 2025 Jul 26.

Abstract

Two-dimensional (2D) layered ferroelectrics, as an emerging area of research, have attracted extensive attention, while memristors based on 2D ferroelectric materials are yet to be fully explored, thereby limiting their applications in modern nanoelectronics. In this work, we report the observation of intrinsic memristive behavior in a recently discovered 2D in-plane ferroelectric material, NbOI, and the giant enhancement of the memristive performance by using light-emission diode (LED) visible light. The results show that NbOI devices exhibit an intrinsically strong memristive response with a current on/off ratio of up to 10 and stable switching cycles, which is largely independent of the back-gate voltage. Under LED visible light illumination, the current on/off ratio in NbOI is over 1 order of magnitude higher than that without light; meanwhile, the coercive field is significantly reduced to less than ∼1.22 kV/cm, much lower than other 2D ferroelectric-based memristors. Interestingly, both the intrinsic and light-enhanced resistive switching phenomena only occur along the in-plane -axis direction, indicating that the memristive behavior in NbOI is driven by electric field-induced and optical field-enhanced ferroelectric polarization switching mechanisms, as evidenced by a combined orientation-dependent electrical/optoelectrical measurement and lateral piezoresponse force microscopy analysis. Our study not only provides a materials strategy based on 2D in-plane ferroelectrics for designing memristive devices but also offers a simple optical method to enhance device performance, facilitating their implementation in next-generation nanoelectronics and optoelectronics.

摘要

二维(2D)层状铁电体作为一个新兴的研究领域,已引起广泛关注,而基于二维铁电材料的忆阻器尚未得到充分探索,从而限制了它们在现代纳米电子学中的应用。在这项工作中,我们报告了在最近发现的二维面内铁电材料NbOI中观察到本征忆阻行为,以及通过使用发光二极管(LED)可见光实现忆阻性能的巨大增强。结果表明,NbOI器件表现出本征的强忆阻响应,电流开/关比高达10,且具有稳定的开关循环,这在很大程度上与背栅电压无关。在LED可见光照射下,NbOI中的电流开/关比比无光照时高出1个数量级以上;同时,矫顽场显著降低至小于~1.22 kV/cm,远低于其他基于二维铁电体的忆阻器。有趣的是,本征和光增强电阻开关现象都仅沿面内轴方向发生,这表明NbOI中的忆阻行为是由电场诱导和光场增强的铁电极化切换机制驱动的,这一点通过结合取向相关的电学/光电测量和横向压电力显微镜分析得到了证实。我们的研究不仅为设计忆阻器件提供了一种基于二维面内铁电体的材料策略,还提供了一种简单的光学方法来提高器件性能,促进它们在下一代纳米电子学和光电子学中的应用。

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