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基于绝缘体上硅光波导的折射率传感器,采用多槽亚波长光栅马赫-曾德尔干涉仪。

SOI optical waveguide-based refractive index sensor using a multi-slot subwavelength grating Mach-Zehnder interferometer.

作者信息

Guo YiFei, Yan BoXia, Qi Yan

出版信息

Appl Opt. 2025 Jul 20;64(21):5896-5902. doi: 10.1364/AO.565849.

Abstract

A compact and high-sensitivity Mach-Zehnder interferometer refractive index sensor is designed and fabricated on a standard 0.18 µm silicon-on-insulator process. The key is the design of a multi-slot subwavelength grating (MSGG) waveguide in the sensing arm, which synergistically combines the strong optical confinement of slot waveguides with the engineered dispersion of subwavelength gratings. By leveraging this MSSG structure, the device achieves a high experimental sensitivity of 462.4 nm/RIU for a sensing length of only 100 µm. The sensor's compatibility with standard, low-cost CMOS fabrication positions it as a promising and scalable solution for a variety of integrated optical sensing applications.

摘要

一种紧凑且高灵敏度的马赫-曾德尔干涉仪折射率传感器采用标准的0.18微米绝缘体上硅工艺进行设计和制造。关键在于传感臂中多槽亚波长光栅(MSGG)波导的设计,它将槽波导的强光学限制与亚波长光栅的工程色散协同结合。通过利用这种MSSG结构,该器件在仅100微米的传感长度下实现了462.4纳米/RIU的高实验灵敏度。该传感器与标准低成本CMOS制造工艺的兼容性使其成为各种集成光学传感应用中一种有前景且可扩展的解决方案。

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