LCFC-Laptop: A Benchmark Dataset for Detecting Surface Defects in Consumer Electronics.

As a high-market-value sector, the consumer electronics industry is particularly vulnerable to reputational damage from surface defects in shipped products. However, the high level of automation and the short product life cycles in this industry make defect sample collection both difficult and inefficient. This challenge has led to a severe shortage of publicly available, comprehensive datasets dedicated to surface defect detection, limiting the development of targeted methodologies in the academic community. Most existing datasets focus on general-purpose object categories, such as those in the COCO and PASCAL VOC datasets, or on industrial surfaces, such as those in the MvTec AD and ZJU-Leaper datasets. However, these datasets differ significantly in structure, defect types, and imaging conditions from those specific to consumer electronics. As a result, models trained on them often perform poorly when applied to surface defect detection tasks in this domain. To address this issue, the present study introduces a specialized optical sampling system with six distinct lighting configurations, each designed to highlight different surface defect types. These lighting conditions were calibrated by experienced optical engineers to maximize defect visibility and detectability. Using this system, 14,478 high-resolution defect images were collected from actual production environments. These images cover more than six defect types, such as scratches, plain particles, edge particles, dirt, collisions, and unknown defects. After data acquisition, senior quality control inspectors and manufacturing engineers established standardized annotation criteria based on real-world industrial acceptance standards. Annotations were then applied using bounding boxes for object detection and pixelwise masks for semantic segmentation. In addition to the dataset construction scheme, commonly used semantic segmentation methods were benchmarked using the provided mask annotations. The resulting dataset has been made publicly available to support the research community in developing, testing, and refining advanced surface defect detection algorithms under realistic conditions. To the best of our knowledge, this is the first comprehensive, multiclass, multi-defect dataset for surface defect detection in the consumer electronics domain that provides pixel-level ground-truth annotations and is explicitly designed for real-world applications.