Polarization-Sensitive Photodetector Based on WSe/AsP/WS Heterojunction.

The rapid advancements in optoelectronics and their widespread applications have spurred the development of high-performance photodetectors. This study presents a dual-van der Waals heterostructure photodetector, composed of WSe, AsP, and WS. It demonstrates outstanding polarization-sensitive light detection without external bias, with a sensitivity of 487 mA/W, a detection capability of 6.09 × 10 Jones, and an external quantum efficiency (EQE) of 95% at 635 nm, along with rise/fall times of 18-36 ms. The device also exhibits notable anisotropic polarization sensitivity (4.8 at 405 nm). With its broad spectral coverage (400-1100 nm), fast response, and high sensitivity, this photodetector shows significant promise for imaging applications. The development of anisotropic van der Waals heterojunctions provides a key reference for the design of high-performance, self-powered polarization photodetectors.