Lecar H, Nossal R
Biophys J. 1971 Dec;11(12):1068-84. doi: 10.1016/S0006-3495(71)86278-1.
Threshold fluctuations in axon firing can arise as a result of electrical noise in the excitable membrane. A general theoretical expression for the fluctuations is applied to the analysis of three sources of membrane noise: Johnson noise, excess 1/f noise, and sodium conductance fluctuations. Analytical expressions for the width of the firing probability curve are derived for each of these noise sources. Specific calculations are performed for the node of Ranvier of the frog, and attention is given to the manner in which threshold fluctuations are affected by variations of temperature, ion concentrations, and the application of various drugs. Comparison with existing data suggests that threshold fluctuations can best be explained by sodium conductance fluctuations. Additional experiments directed at distinguishing among the various noise sources are proposed.
轴突放电中的阈值波动可能是由于可兴奋膜中的电噪声引起的。波动的一般理论表达式被应用于分析膜噪声的三个来源:约翰逊噪声、过量的1/f噪声和钠电导波动。针对这些噪声源中的每一个,推导了放电概率曲线宽度的解析表达式。对青蛙的郎飞结进行了具体计算,并关注了温度、离子浓度变化以及各种药物的应用对阈值波动的影响方式。与现有数据的比较表明,阈值波动最好用钠电导波动来解释。还提出了旨在区分各种噪声源的额外实验。