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姐妹染色单体交换的复制绕过模型及其对布卢姆综合征和范科尼贫血的影响。

Replication bypass model of sister chromatid exchanges and implications for Bloom's syndrome and Fanconi's anemia.

作者信息

Shafer D A

出版信息

Hum Genet. 1977 Nov 10;39(2):177-90. doi: 10.1007/BF00287010.

Abstract

A model of the sister chromatid exchange (SCE) process is outlined as a replication mechanism to bypass DNA crosslinks. The model suggests that when normal bidirectional replication advances from both sides towards a crosslink along the two opposite parental strands, the complementary parental strand segments can be temporarily displaced at each contralateral 5' side from the crosslink. The free ends produced in this first step will be terminally aligned but will have opposite polarity. The second step of the bypass can, however, be completed by either of two rejoining processes--terminal ligation of the free ends via nascent Okazaki pieces or aberrant complementation by overlapping the free ends. This bypass mechanism (1) allows replication to continue past a crosslink leaving it intact but (2) results in the switching of parental strands and their attached incomplete nascent strands above and below the crosslink site producing an exchange between sister chromatids. This model is compatible with the findings of current SCE studies using the new BUDR/stain techniques as well as with previous autoradiographic studies. It also suggests that the chromatid breaks and deletions in Fanconi's Anemia represent a defect in step two of the replication bypass mechanism and that the high frequency of SCE's and quadriradials in Bloom's Syndrome represent the SCE overload effects of a defect in crosslink repair.

摘要

一种姐妹染色单体交换(SCE)过程的模型被概述为一种绕过DNA交联的复制机制。该模型表明,当正常的双向复制沿着两条相反的亲代链从两侧向交联处推进时,互补的亲代链片段可在交联处两侧的每个对侧5'端暂时移位。第一步产生的自由末端将在末端对齐,但极性相反。然而,绕过的第二步可以通过两种重新连接过程中的任何一种来完成——通过新生的冈崎片段对自由末端进行末端连接,或者通过自由末端重叠进行异常互补。这种绕过机制(1)允许复制继续越过交联处而使其保持完整,但(2)导致亲代链及其在交联位点上方和下方附着的不完全新生链发生交换,从而在姐妹染色单体之间产生交换。该模型与目前使用新的溴脱氧尿苷(BUDR)/染色技术的SCE研究结果以及以前的放射自显影研究结果相符。它还表明,范可尼贫血中的染色单体断裂和缺失代表复制绕过机制第二步中的缺陷,而布卢姆综合征中SCE和四射体的高频率代表交联修复缺陷的SCE过载效应。

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