Expression of eight unrelated Muc+ plasmids in eleven DNA repair-deficient E. coli strains.

23 plasmids from different incompatibility groups were tested for their ability to increase post-UV survival and UV-induced reversion to Arg+ in Escherichia coli strain AB1157 argE3 8 plasmids increased mutagenesis, of which 7 increased UV resistance. The exception, plasmid R391, sensitized AB1157 to UV. All 8 plasmids were absolutely dependent upon host recA+ and lexA+ genotypes for expression of these functions, but were independent of uvrA+, uvrB+, umuC+, recF+, polA+, uvrD+ or recL+. E. coli KMBL91 uvrE was sensitized to UV by R391, but protected by only 3 plasmids. All 8 plasmids restored mutation frequency in the non-mutable TK501 uvrB umuC strain to levels found in the JC3890 uvrB umuC+ parent strain. R391 sensitized TK501 to UV, but all other plasmids increased survival in the strain by over 1000-fold to levels found in the JC3890 uvrB umuC+ R+ strains. Plasmid R391 reduced the UV-protecting effect of R46 when both were present in strain TK501. Mutation frequencies were higher in TK501 (R46) than in TK501 (R391); in TK501 (R46/R391) they were slightly lower than in TK501 (R46).