Danilov R K, Egorova L I
Arkh Patol. 1980;42(4):82-3.
The proposed method allows to measure the thickness of microscopic section by combing the method of air optical wedge and smooth alteration of wave length by means of monochromator. The latter provides exact localization of the interference fringe on the desired zone of the wedge thus sparing the necessity of measuring the interference fringe on the wedge.
所提出的方法通过结合空气光学楔方法和借助单色仪使波长平滑变化的方法来测量微观切片的厚度。后者能将干涉条纹精确地定位在楔的所需区域上,从而无需在楔上测量干涉条纹。