X射线显微断层扫描术
X-ray microtomography.
作者信息
Elliott J C, Dover S D
出版信息
J Microsc. 1982 May;126(Pt 2):211-3. doi: 10.1111/j.1365-2818.1982.tb00376.x.
Abstract
A microscope system based on the principles of computerized axial tomography is described for determining the distribution of the X-ray absorption coefficient in a slice from a solid object without cutting sections. An application is given to determining the distribution at a resolution of about 15 micrometer through a shell of about 0.5 mm diameter.
摘要
描述了一种基于计算机轴向断层扫描原理的显微镜系统，用于在不切割切片的情况下确定固体物体切片中X射线吸收系数的分布。给出了一个应用实例，即通过直径约0.5毫米的外壳以约15微米的分辨率确定分布情况。
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