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X射线计算机断层扫描中的指数边缘梯度效应。

The exponential edge-gradient effect in x-ray computed tomography.

作者信息

Joseph P M, Spital R D

出版信息

Phys Med Biol. 1981 May;26(3):473-87. doi: 10.1088/0031-9155/26/3/010.

Abstract

The exponential edge-gradient effect must arise in any x-ray transmission CT scanner whenever long sharp edges of high contrast are encountered. The effect is non-linear and is due to the interaction of the exponential law of x-ray attenuation and the finite width of the scanning beam in the x-y plane. The error induced in the projection values is proved to be always negative. While the most common effect is lucent streaks emerging from single straight edges, it is demonstrated that dense streaks from pairs of edges are possible. It is shown that an exact correction of the error is possible only under very special (and rather unrealistic) circumstances in which an infinite number of samples per beam width are available and all thin rays making up the beam can be considered parallel. As a practical matter, nevertheless, increased sample density is highly desirable in making good approximate corrections; this is demonstrated with simulated scans. Two classes of approximate correction algorithms are described and their effectiveness evaluated on simulated CT phantom scans. One such algorithm is also shown to work well with a real scan of a physical phantom on a machine that provides approximately four samples per beam width.

摘要

在任何X射线透射计算机断层扫描(CT)扫描仪中,只要遇到高对比度的长而锐利的边缘,就必然会出现指数边缘梯度效应。这种效应是非线性的,是由X射线衰减的指数规律与扫描束在x-y平面上的有限宽度相互作用引起的。经证明,投影值中产生的误差始终为负。虽然最常见的效应是从单个直边出现的透光条纹,但已证明成对边缘产生密集条纹也是可能的。结果表明,只有在非常特殊(且相当不现实)的情况下,即每束宽有无限数量的样本且构成束的所有细射线都可视为平行时,才有可能对误差进行精确校正。然而,实际上,增加样本密度对于进行良好的近似校正非常有必要;这在模拟扫描中得到了证明。描述了两类近似校正算法,并在模拟CT体模扫描中评估了它们的有效性。还表明,其中一种算法在一台每束宽提供约四个样本的机器上对物理体模的实际扫描中也能很好地工作。

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