Graham S W, Hercules D M
J Biomed Mater Res. 1981 Jul;15(4):465-77. doi: 10.1002/jbm.820150403.
The objective of this work was to determine whether there is a significant difference in composition between the air facing and mold facing sides of Biomer and to see if the mold itself affects the polymer surface. A detailed analysis of Biomer was undertaken using x-ray photoelectron spectroscopy (ESCA), secondary ion mass spectroscopy (SIMS), and low energy ion scattering spectroscopy (ISS). Previous workers have used FTIR and ESCA to study Biomer and comparisons with their results will be discussed. Because of the increase in surface sensitivity SIMS and ISS can be valuable tools for studying polymeric materials. SIMS has been used to identify the structure of the Biomer air and mold facing surfaces from both glass and nickel molds. ESCA and ISS have indicated the presence of a silicon contaminant on the air and mold facing surfaces and SIMS has shown that the form of the silicon contaminant is probably a polysiloxane.
这项工作的目的是确定Biomer面向空气的一面和面向模具的一面在组成上是否存在显著差异，并探究模具本身是否会影响聚合物表面。使用X射线光电子能谱（ESCA）、二次离子质谱（SIMS）和低能离子散射光谱（ISS）对Biomer进行了详细分析。之前的研究人员已使用傅里叶变换红外光谱（FTIR）和ESCA来研究Biomer，本文将讨论与他们研究结果的比较。由于表面灵敏度的提高，SIMS和ISS对于研究聚合物材料可能是有价值的工具。SIMS已用于识别来自玻璃模具和镍模具的Biomer面向空气和面向模具表面的结构。ESCA和ISS表明在面向空气和面向模具的表面存在硅污染物，而SIMS显示硅污染物的形式可能是聚硅氧烷。
