Chen C S, Doi K, Vyborny C, Chan H P, Holje G
Med Phys. 1980 Nov-Dec;7(6):627-35. doi: 10.1118/1.594706.
Accurate determination of diagnostic x-ray spectra requires, among many other technical considerations, correction of the experimental data for the energy-dependent response of the x-ray detector. In this study, we investigated the energy response of three types of detectors (intrinsic germanium, lithium-drifted silicon, and sodium iodide) commonly used in the diagnostic energy range. We used a Monte Carlo simulation technique to compute photopeak efficiencies, escape peak losses, and Compton fractions as a function of incident x-ray energy for a variety of detector thicknesses and diameters. Calculated responses were compared with experimental results obtained for the Ge and Si(Li) detectors. The measurements, in which we used fluorescent x ray to simulate the monoenergetic beams assumed for the calculations, indicate good agreement between theoretical and experimental approaches. Techniques for correction of measured spectra for the known response of the detector were also evaluated.
准确测定诊断用X射线光谱，在诸多技术考量中，需要对X射线探测器的能量相关响应的实验数据进行校正。在本研究中，我们调查了诊断能量范围内常用的三种探测器（本征锗、锂漂移硅和碘化钠）的能量响应。我们使用蒙特卡罗模拟技术，针对各种探测器厚度和直径，计算作为入射X射线能量函数的光电峰效率、逃逸峰损失和康普顿分数。将计算得到的响应与锗探测器和锂漂移硅探测器的实验结果进行比较。我们使用荧光X射线模拟计算中假设的单能束进行的测量表明，理论方法和实验方法之间吻合良好。还评估了针对探测器已知响应校正测量光谱的技术。
