Chaisrisookumporn N, Stella J P, Epker B N
Department of Oral and Maxillofacial Surgery, John Peter Smith Hospital, Fort Worth, Texas 76104, USA.
Oral Surg Oral Med Oral Pathol Oral Radiol Endod. 1995 Aug;80(2):137-44. doi: 10.1016/s1079-2104(05)80192-1.
This study was done to determine those abnormal cephalometric features found in adult cleft lip and palate patients. The sample population consisted of 30 randomly selected white patients with cleft lip and palate who were treated by the same team that had been accredited by the American Cleft Palate-Craniofacial Association. Twenty patients had unilateral complete clefts, and 10 had bilateral complete clefts. Thirteen different cephalometric parameters were measured and compared with normal. The results from this study showed that there were few statistically significant differences between the unilateral and bilateral cleft palate patient populations. There were only three measurements that had statistically significant differences between the unilateral cleft patients and the bilateral cleft patients: subnasale-stomion, subnasale-stomion: stomion-soft-tissue menton, and subnasale-lower lip vermillion: lower lip vermillion-soft tissue menton. However, 10 of the 13 measurements had statistically significant variations from normal. These measurements included subnasale=stomion; stomion=soft tissue menton, subnasale=lower lip vermillion; lower lip vermillion=soft tissue menton, interlabial distance, subnasale-perpendicular to upper lip, subnasale-perpendicular to lower lip, subnasale-perpendicular to chin, angle formed between sella turcica=nasion and nasion=A=point, maxillary depth angle, A-point to nasion-pogonion, and angle formed between A=point=nasion and nasion=B=point. The data indicated that a multiplicity of vertical and horizontal abnormalities exist in the person with cleft lip and palate in addition to the well-known transverse deficiencies, and that cephalometric abnormalities are not limited to anteroposterior maxillary deficiency.
本研究旨在确定成年唇腭裂患者中存在的那些异常头影测量特征。样本群体由30名随机选取的患有唇腭裂的白人患者组成，他们由同一个获得美国腭裂-颅面协会认可的团队进行治疗。20名患者为单侧完全性腭裂，10名患者为双侧完全性腭裂。测量了13个不同的头影测量参数并与正常值进行比较。本研究结果表明，单侧和双侧腭裂患者群体之间在统计学上几乎没有显著差异。单侧腭裂患者和双侧腭裂患者之间只有三项测量存在统计学显著差异：鼻下点-口裂点、鼻下点-口裂点：口裂点-软组织颏前点，以及鼻下点-下唇唇红缘：下唇唇红缘-软组织颏前点。然而，13项测量中有10项与正常值存在统计学显著差异。这些测量包括鼻下点=口裂点；口裂点=软组织颏前点，鼻下点=下唇唇红缘；下唇唇红缘=软组织颏前点，唇间距离，鼻下点-垂直于上唇，鼻下点-垂直于下唇，鼻下点-垂直于下巴，蝶鞍点=鼻根点与鼻根点=A点之间形成的角度，上颌深度角，A点至鼻根点-颏前点，以及A点=鼻根点与鼻根点=B点之间形成的角度。数据表明，除了众所周知的横向缺陷外，唇腭裂患者还存在多种垂直和水平异常，并且头影测量异常不仅限于上颌前后向发育不足。
