植物染色体的原子力显微镜观察

Atomic force microscopy of plant chromosomes.

作者信息

Winfield M, McMaster T J, Karp A, Miles M J

机构信息

Department of Agricultural Sciences, University of Bristol, UK.

出版信息

Chromosome Res. 1995 Mar;3(2):128-31. doi: 10.1007/BF00710674.

DOI:10.1007/BF00710674

PMID:7749562

Abstract

Atomic force microscopy has been used to image plant chromosomes from standard preparations without staining or coating. This has enabled the collection of high-resolution three-dimensional data on surface structure. The technique has been further applied to the imaging of C-banded chromosomes revealing structural changes resulting from the banding treatment. The bands were observed as localized areas of high relief.

摘要

原子力显微镜已被用于对未经染色或涂层处理的标准制备植物染色体进行成像。这使得能够收集关于表面结构的高分辨率三维数据。该技术已进一步应用于C带染色体成像，揭示了带处理导致的结构变化。这些带被观察为高浮雕的局部区域。