Harrison C J, Jack E M, Allen T D, Harris R
J Cell Sci. 1985 Aug;77:143-53. doi: 10.1242/jcs.77.1.143.
A technique has been developed to examine the same G-banded human metaphase chromosomes, first in the light microscope and then in the scanning electron microscope (SEM). A structural involvement in chromosome banding was confirmed by a positional correlation between the G-positive bands observed in the light microscope and the circumferential grooves between the quaternary coils of the metaphase chromosomes, observed in the SEM. In further support of this the regions between the grooves showed a positional relationship with the G-negative or reverse (R) bands. The examination of slightly extended metaphase chromosomes in the light microscope demonstrated that the G-banding pattern corresponded to that described by the Paris nomenclature for metaphase chromosomes. The arrangement of the circumferential grooves of the same chromosomes, observed in the SEM, was shown to relate to that described by the Paris nomenclature for prometaphase chromosomes. Therefore, using the SEM it is possible to demonstrate the details of prometaphase banding in metaphase chromosomes.
已经开发出一种技术，用于检查相同的G带人类中期染色体，首先在光学显微镜下，然后在扫描电子显微镜（SEM）下进行检查。通过光学显微镜下观察到的G阳性带与SEM下观察到的中期染色体四级螺旋之间的圆周凹槽之间的位置相关性，证实了染色体带中的结构参与。进一步支持这一点的是，凹槽之间的区域与G阴性或反向（R）带显示出位置关系。在光学显微镜下对稍微伸展的中期染色体进行检查表明，G带模式与巴黎中期染色体命名法所描述的一致。在SEM下观察到的相同染色体的圆周凹槽排列与巴黎早中期染色体命名法所描述的相关。因此，使用SEM可以展示中期染色体早中期带的细节。
