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[精神分裂症计算机断层扫描特征的遗传分析]

[A genetic analysis of the computed tomographic traits in schizophrenia].

作者信息

Orlova V A, Vavilov S B, Trubnikov V I, Belova O G

出版信息

Zh Nevrol Psikhiatr Im S S Korsakova. 1994;94(2):85-90.

PMID:7941902
Abstract

The authors analyze clinical and CT evidence obtained on schizophrenic families (42 probands, 70 parents and 23 siblings) versus 162 healthy volunteers. Heritability coefficients were estimated for CT-parameters. Positive and negative psychopathological symptoms and CT-parameters seem to be correlated. It was established that such CT parameters as width of the frontal horn of the left lateral ventricle in the area of nucleus caudatus, width of the central compartment of the left lateral ventricle, width of the frontal horn of the right lateral ventricle in the area of nucleus caudatus, width of the central compartment of the right lateral ventricle may be regarded as markers of predisposition to schizophrenia. The results support the hypothesis on the role of genetic predisposition in the development of neuropathological changes in schizophrenic patients. This may be utilized in medico-genetic consulting and for formulation of the disease prognostic criteria.

摘要

作者分析了从精神分裂症患者家庭(42名先证者、70名父母和23名兄弟姐妹)与162名健康志愿者身上获取的临床和CT证据。对CT参数的遗传系数进行了估算。阳性和阴性精神病理症状与CT参数似乎存在相关性。已确定,诸如尾状核区域左侧脑室额角宽度、左侧脑室中央隔宽度、尾状核区域右侧脑室额角宽度、右侧脑室中央隔宽度等CT参数可被视为精神分裂症易感性的标志物。这些结果支持了关于遗传易感性在精神分裂症患者神经病理变化发展中作用的假说。这可用于医学遗传咨询以及制定疾病预后标准。

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