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酵母中DNA双链断裂重新连接的半衰期值可能会因辐照条件的不同而相差一个数量级以上。

Half-life values for DNA double-strand break rejoining in yeast can vary by more than an order of magnitude depending on the irradiation conditions.

作者信息

Frankenburg-Schwager M, Harbich R, Beckonert S, Frankenberg D

机构信息

University of Göttingen, Abtlg. Klinikum Strahlenbiologie und Klinikum Strahlenphysik, Germany.

出版信息

Int J Radiat Biol. 1994 Nov;66(5):543-7. doi: 10.1080/09553009414551591.

DOI:10.1080/09553009414551591
PMID:7983443
Abstract

Yeast cells in stationary phase were exposed under oxic or anoxic conditions to sparsely (30 MeV electrons) or densely (3.5 MeV alpha-particles) ionizing radiation. For all four experimental set-ups postirradiation treatment of cells was the same, i.e. cells were kept under oxic conditions in non-growth medium at 30 degrees C. Double-strand break (dsb) rejoining was measured during this treatment yielding the following results: (1) half-life values ranged from < 60 min (electrons, anoxia) to 3.8 h (low doses of electrons, oxia), 7 h (alpha-particles, anoxia), 10 h (high doses of electrons, oxia) and 13 h (alpha-particles, oxia). (2) In the case of exposure of oxic cells to electrons a biphasic rejoining kinetics is observed with a dose-dependent increase of the fraction of the slow component. These results suggest that half-life values of dsb rejoining in a given cell depend on physical, chemical and biological parameters. The rejoining of dsb slows down with increasing LET, being probably due to the increasing complexity of dsb. Oxygenation of cells at the time of irradiation affects half-life values, indicating that radiation chemistry plays an important role. The biphasic rejoining kinetics observed for dsb induced by electrons in oxic cells is interpreted in terms of a dose-dependent change of chromatin structure hindering the interaction between damaged chromatin and the rejoining enzymes rather than by two chemically distinct types of dsb with differing half-life values.

摘要

将处于稳定期的酵母细胞在有氧或无氧条件下暴露于稀疏(30 MeV电子)或密集(3.5 MeVα粒子)电离辐射中。对于所有四种实验设置,细胞的辐照后处理是相同的,即细胞在30℃的非生长培养基中保持在有氧条件下。在该处理过程中测量双链断裂(dsb)的重新连接,得到以下结果:(1)半衰期值范围从<60分钟(电子,无氧)到3.8小时(低剂量电子,有氧)、7小时(α粒子,无氧)、10小时(高剂量电子,有氧)和13小时(α粒子,有氧)。(2)在有氧细胞暴露于电子的情况下,观察到双相重新连接动力学,慢组分的比例随剂量增加。这些结果表明,给定细胞中dsb重新连接的半衰期值取决于物理、化学和生物学参数。随着传能线密度(LET)增加dsb的重新连接减慢,这可能是由于dsb的复杂性增加。辐照时细胞的氧合作用影响半衰期值,表明辐射化学起重要作用。在有氧细胞中由电子诱导的dsb观察到的双相重新连接动力学,根据染色质结构的剂量依赖性变化来解释,这种变化阻碍了受损染色质与重新连接酶之间的相互作用,而不是由具有不同半衰期值的两种化学性质不同的dsb类型导致的。

相似文献

1
Half-life values for DNA double-strand break rejoining in yeast can vary by more than an order of magnitude depending on the irradiation conditions.酵母中DNA双链断裂重新连接的半衰期值可能会因辐照条件的不同而相差一个数量级以上。
Int J Radiat Biol. 1994 Nov;66(5):543-7. doi: 10.1080/09553009414551591.
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A comparative study of rejoining of DNA double-strand breaks in yeast irradiated with 3.5 MeV alpha-particles or with 30 MeV electrons.
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Evidence for complexity at the nanometer scale of radiation-induced DNA DSBs as a determinant of rejoining kinetics.辐射诱导的DNA双链断裂在纳米尺度上的复杂性作为重新连接动力学决定因素的证据。
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Different oxygen enhancement ratios for induced and unrejoined DNA double-strand breaks in eukaryotic cells.真核细胞中诱导型和未连接型DNA双链断裂的不同氧增强比。
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Survival curves with shoulders: damage interaction, unsaturated but dose-dependent rejoining kinetics or inducible repair of DNA double-strand breaks?具有肩部的存活曲线:损伤相互作用、不饱和但剂量依赖性的重新连接动力学还是DNA双链断裂的诱导性修复?
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Exponential or shouldered survival curves result from repair of DNA double-strand breaks depending on postirradiation conditions.指数型或有坪的存活曲线是由DNA双链断裂的修复产生的,这取决于照射后的条件。
Radiat Res. 1988 Apr;114(1):54-63.

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