Pallon J, Knox J
Lund Institute of Technology, Sweden.
Scanning Microsc. 1993 Dec;7(4):1207-11; discussion 1211-4.
Quantitative and structural elemental information is available from the nuclear microprobe through a time consuming fit of the (X-ray) spectrum at each point. An alternative technique is proposed which greatly shortens the analysis procedure and allows an increased number of samples to be processed. The method discussed here is to create elemental maps which, when they are divided by the charge/pixel and multiplied by a scaling factor, will form quantitative maps. The scaling factors are obtained from a calibration procedure comparing a large number of fitted X-ray spectra with the corresponding contents of selected energy windows. The technique also allows the reduction of artefacts due to spectral overlap, assuming that a simple background model can be used.
通过对每个点的(X射线)光谱进行耗时的拟合,可以从核微探针获得定量和结构元素信息。本文提出了一种替代技术,该技术大大缩短了分析过程,并允许处理更多数量的样品。这里讨论的方法是创建元素图,当这些元素图除以电荷/像素并乘以比例因子时,将形成定量图。比例因子是通过将大量拟合的X射线光谱与选定能量窗口的相应含量进行比较的校准程序获得的。假设可以使用简单的背景模型,该技术还可以减少由于光谱重叠而产生的伪影。