Jones J E, Rodnick E H, Goldstein M J, McPherson S R, West K L
Arch Gen Psychiatry. 1977 Jan;34(1):71-4. doi: 10.1001/archpsyc.1977.01770130073007.
The presence of a pattern of parental transactional style deviance on the Thematic Apperception Test (TAT) (a significant attribute of parents of offspring with schizophrenia spectrum disorders) was used to identify a group of disturbed nonpsychotic adolescents hypothesized to be at high risk for subsequently developing schizophreniform psychopathology. High-risk male adolescents came from two symptom groups, withdrawn adolescents and adolescents in active family conflict, which are symptom patterns similar to the premorbid pictures of two schizophrenia subtypes. High-risk parents also tended to show transactional style deviance in direct interaction with their child and in a written statement describing their child's problem. The degree of risk was significantly related to the amount of therapy in which the family was subsequently engaged and, at a four-year follow-up, to the level of adjustment of the adolescents seen earlier in the project.
主题统觉测验（TAT）中父母交易风格偏差模式的存在（精神分裂症谱系障碍患者父母的一个显著特征）被用于识别一组被认为随后发展为精神分裂样精神病理学高风险的情绪困扰非精神病青少年。高风险男性青少年来自两个症状组，即退缩青少年和处于家庭激烈冲突中的青少年，这两种症状模式类似于两种精神分裂症亚型的病前表现。高风险父母在与孩子的直接互动以及描述孩子问题的书面陈述中也往往表现出交易风格偏差。风险程度与该家庭随后接受治疗的时长显著相关，并且在四年随访中，与项目早期观察到的青少年的适应水平相关。
