Yang J, Shao Z
Department of Physiology, University of Virginia, Charlottesville 22908.
Ultramicroscopy. 1993 Jul;50(2):157-70. doi: 10.1016/0304-3991(93)90006-j.
Experimental results are presented to show that the adhesion force is the single most important limiting factor in high-resolution atomic force microscopy of DNA in air, prepared by the cytochrome-C-assisted spreading method. It is also shown that humidity plays a minor role in the control of probe force. Using a pure carbon film as the substrate to clean the AFM tip prior to imaging, it is demonstrated that 4-6 nm resolution on DNA can be routinely obtained by the atomic force microscope with commercial Si3N4 pyramid cantilevers. We also show that in organic solvents a resolution of up to 3 nm can be obtained under optimal conditions.
实验结果表明，在通过细胞色素C辅助铺展法制备的空气中DNA的高分辨率原子力显微镜检测中，粘附力是唯一最重要的限制因素。研究还表明，湿度在探针力控制中作用较小。在成像前使用纯碳膜作为底物清洁原子力显微镜探针，结果表明，使用商用Si3N4金字塔形悬臂的原子力显微镜通常可在DNA上获得4至6纳米的分辨率。我们还表明，在有机溶剂中，在最佳条件下可获得高达3纳米的分辨率。
