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通过脉冲力模式原子力显微镜对拉伸的单个DNA分子进行成像。

Imaging stretched single DNA molecules by pulsed-force-mode atomic force microscopy.

作者信息

Kwak K J, Kudo H, Fujihira M

机构信息

Department of Biomolecular Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.

出版信息

Ultramicroscopy. 2003 Oct-Nov;97(1-4):249-55. doi: 10.1016/S0304-3991(03)00049-4.

Abstract

The effect of a surface water layer on DNA strands deposited on a substrate was studied by atomic force microscopy (AFM). DNA molecules were deposited and stretched on chemically modified glass coverslips by a molecular combing method. Lambda bacteriophage DNA molecules were aligned on the organosilane-modified substrate surfaces by chemical and physical adsorption during the molecular combing. The combed DNA molecules were observed in humidity-controlled air and in aqueous solutions by pulsed-force-mode AFM (PFM-AFM). Chemical modification of cantilevers with an Au-coated tip by organothiol compounds was also applied to DNA observation. Mapping adhesive forces in aqueous media was useful to discriminate chemically the DNA strands from the substrate surface. The results suggest that PFM-AFM can be used widely to image the stretched DNA molecules on the silane-modified substrates.

摘要

通过原子力显微镜(AFM)研究了表面水层对沉积在基底上的DNA链的影响。采用分子梳法将DNA分子沉积并拉伸在化学修饰的玻璃盖玻片上。在分子梳理过程中,λ噬菌体DNA分子通过化学和物理吸附排列在有机硅烷修饰的基底表面。通过脉冲力模式原子力显微镜(PFM-AFM)在湿度控制的空气中和水溶液中观察梳理后的DNA分子。用有机硫醇化合物对带有金涂层尖端的悬臂进行化学修饰也应用于DNA观察。绘制水性介质中的粘附力图谱有助于从基底表面化学区分DNA链。结果表明,PFM-AFM可广泛用于对硅烷修饰基底上拉伸的DNA分子进行成像。

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