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超高分子量聚乙烯的低电压扫描电子显微镜成像

Low-voltage scanning electron microscopic imaging of ultrahigh-molecular-weight polyethylene.

作者信息

Pienkowski D, Jacob R, Hoglin D, Saum K, Kaufer H, Nicholls P J

机构信息

Division of Orthopaedic Surgery, Markey Cancer Center, University of Kentucky, Lexington, USA.

出版信息

J Biomed Mater Res. 1995 Oct;29(10):1167-74. doi: 10.1002/jbm.820291002.

DOI:10.1002/jbm.820291002
PMID:8557717
Abstract

Submicron ultrahigh-molecular-weight polyethylene (UHMWPE) wear particles from total joint prostheses may contribute to implant failure through particle-mediated aseptic loosening. The purpose of this study was to examine the microstructure of virgin UHMWPE powder to determine its morphology for future comparison with wear debris. A new method of low-voltage scanning electron microscopy (LVSEM) in an oil-free vacuum was applied, which produced high-resolution images of UHMWPE micromorphology, while minimizing specimen damage and obviating the need for image processing. GUR 415 UHMWPE virgin powder particles were examined by using routine high-voltage SEM, LVSEM, and image analyses. LVSEM showed that UHMWPE particles were composed of submicron-size spherical subparticles connected by numerous nanometer-size fibrils. These spherical subparticles had a highly textured surface morphology seen only by LVSEM. Fracture of the nanometer-size fibrils was observed. Routine high-voltage SEM obfuscates the intricate and delicate UHMWPE micromorphology as well as the damage done by the accompanying high-voltage electrons. This study suggests that the micromorphology of wear particles previously studied with routine high-voltage SEM was overlooked or damaged, justifies the need for LVSEM in future studies, and raises the question of what is the true morphology of polyethylene wear debris retrieved from human tissues.

摘要

全关节假体产生的亚微米级超高分子量聚乙烯(UHMWPE)磨损颗粒可能通过颗粒介导的无菌性松动导致植入失败。本研究的目的是检查原始UHMWPE粉末的微观结构,以确定其形态,以便将来与磨损碎片进行比较。应用了一种在无油真空中进行低电压扫描电子显微镜(LVSEM)的新方法,该方法产生了UHMWPE微观形态的高分辨率图像,同时将样品损伤降至最低并无需进行图像处理。通过常规高电压扫描电子显微镜、LVSEM和图像分析对GUR 415 UHMWPE原始粉末颗粒进行了检查。LVSEM显示,UHMWPE颗粒由通过许多纳米级原纤维连接的亚微米级球形亚颗粒组成。这些球形亚颗粒具有仅通过LVSEM才能看到的高度纹理化的表面形态。观察到纳米级原纤维的断裂。常规高电压扫描电子显微镜掩盖了复杂而精细的UHMWPE微观形态以及伴随的高电压电子造成的损伤。本研究表明,以前用常规高电压扫描电子显微镜研究的磨损颗粒的微观形态被忽视或损坏,证明了未来研究中使用LVSEM的必要性,并提出了从人体组织中回收的聚乙烯磨损碎片的真实形态是什么的问题。

相似文献

1
Low-voltage scanning electron microscopic imaging of ultrahigh-molecular-weight polyethylene.超高分子量聚乙烯的低电压扫描电子显微镜成像
J Biomed Mater Res. 1995 Oct;29(10):1167-74. doi: 10.1002/jbm.820291002.
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A comparison of the wear and debris generation of GUR 1120 (compression moulded) and GUR 4150HP (ram extruded) ultra high molecular weight polyethylene.GUR 1120(压缩成型)和GUR 4150HP(柱塞挤出)超高分子量聚乙烯的磨损及磨屑生成比较。
Biomed Mater Eng. 1999;9(2):113-24.
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[New metod for quantification of UHMWPE wear particles around joint replacements].[关节置换周围超高分子量聚乙烯磨损颗粒定量的新方法]
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[Method for assessment of distribution of UHMWPE wear particles in periprosthetic tissues in total hip arthroplasty].[全髋关节置换术中评估超高分子量聚乙烯磨损颗粒在假体周围组织中分布的方法]
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Surface micromechanics of ultrahigh molecular weight polyethylene: Microindentation testing, crosslinking, and material behavior.超高分子量聚乙烯的表面微观力学:微压痕测试、交联及材料行为
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Isolation and characterization of UHMWPE wear particles down to ten nanometers in size from in vitro hip and knee joint simulators.从体外髋关节和膝关节模拟器中分离并表征尺寸低至10纳米的超高分子量聚乙烯磨损颗粒。
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Isolation of predominantly submicron-sized UHMWPE wear particles from periprosthetic tissues.从假体周围组织中分离出主要为亚微米级的超高分子量聚乙烯磨损颗粒。
J Biomed Mater Res. 1995 Jan;29(1):127-31. doi: 10.1002/jbm.820290118.
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[MORF method for assessment of the size and shape of UHMWPE wear microparticles and nanoparticles in periprosthetic tissues].[用于评估假体周围组织中UHMWPE磨损微粒和纳米颗粒大小及形状的MORF方法]
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