Fewell T R, Shuping R E
Med Phys. 1977 May-Jun;4(3):187-97. doi: 10.1118/1.594364.
A high-purity germanium spectrometer system was used to determine primary x-ray spectra over the 45--90-kVp region. Methods were devised for producing and examining spectra stimulating diagnostic conditions without operating the x-ray generator at high current levels. The techniques used to correct the experimental data and produce a photon fluence spectrum are discussed. The results, presented graphically and in tables, have been normalized to yield the relative number of photons per 2-keV interval. Methods for converting a normalized spectrum into a photon fluence spectrum that will produce an exposure of 1 R are presented. The analytical model and procedures used to calculate the K-escape fraction are discussed.
使用高纯度锗光谱仪系统来测定45 - 90千伏峰值区域的初级X射线光谱。设计了在不使X射线发生器处于高电流水平的情况下产生和检查模拟诊断条件光谱的方法。讨论了用于校正实验数据并生成光子注量光谱的技术。以图表形式呈现的结果已进行归一化处理，以得出每2千电子伏特间隔内光子的相对数量。介绍了将归一化光谱转换为能产生1伦琴曝光量的光子注量光谱的方法。讨论了用于计算K逃逸分数的分析模型和程序。
