Barkovich A J, Kuzniecky R I
Neuroradiology Section, University of California, San Francisco, 94143-0628, USA.
J Clin Neurophysiol. 1996 Nov;13(6):481-94. doi: 10.1097/00004691-199611000-00003.
Neuroimaging is playing an increasingly important role in the evaluation of patients with malformations of cerebral cortical development. In this review, the authors address optimal neuroimaging of cortical malformations using x-ray computed tomography, single-photon-emission computed tomography, positron emission tomography, magnetic resonance imaging, and magnetic resonance spectroscopy. Initially, the authors discuss the strengths and weaknesses of the various imaging techniques. This is followed by a discussion of the clinical and neuroimaging characteristics of several different imaging manifestations of focal malformations of cortical development, including polymicrogyria, focal subcortical heterotopia, schizencephaly, focally thickened gyri, focally irregular gyri, hemimegalencephaly, and transmural dysplasia. The authors intend that, after reading this review, the reader will have a better understanding of the optimal neuroimaging techniques for evaluating these malformations and their many neuroimaging appearances.
神经影像学在大脑皮质发育畸形患者的评估中发挥着越来越重要的作用。在本综述中，作者探讨了使用X线计算机断层扫描、单光子发射计算机断层扫描、正电子发射断层扫描、磁共振成像和磁共振波谱对皮质畸形进行最佳神经影像学检查的方法。首先，作者讨论了各种成像技术的优缺点。接下来讨论了皮质发育局灶性畸形的几种不同成像表现的临床和神经影像学特征，包括多小脑回、局灶性皮质下异位、脑裂畸形、局灶性脑回增厚、局灶性脑回不规则、半侧巨脑症和透壁发育异常。作者希望读者阅读本综述后，能更好地了解评估这些畸形及其多种神经影像学表现的最佳神经影像学技术。
