Carlson C G
Dept. of Physiology, Kirksville College of Osteopathic Medicine, MO 63501, USA.
J Neurosci Methods. 1996 Dec;70(1):83-9. doi: 10.1016/S0165-0270(96)00106-9.
The objective of this study was to determine the relationship between the magnitude of the membrane resistance in the free area of a cell-attached patch-clamp recording and the change in total patch circuit resistance that would be produced by the introduction of a series resistance, such as would be observed upon acquiring a patch-clamped membrane vesicle. The results describe a method for determining the magnitude of the membrane resistance in the free area of a membrane patch, and demonstrate that: (a) at a given value of shunt resistance, areas of membrane with higher resistivity produce smaller proportional increases in total patch circuit resistance upon acquiring a membrane vesicle; and (b) a presumption of spherical vesicle formation provides a lower limit estimate of the membrane resistance. The described procedures and relationships are useful in developing new techniques for examining channel activity in membrane patches where individual events are below the present limits of detection, for examining changes in membrane resistivity and/or shunt resistance in patches undergoing cytoskeletal re-organization, and for assessing the potential influence of series resistance changes on single channel parameters in longer term cell-attached patch-clamp recordings.
本研究的目的是确定在细胞贴附式膜片钳记录的自由区域中膜电阻的大小与引入串联电阻（如在获取膜片钳制的膜囊泡时所观察到的）所产生的总膜片电路电阻变化之间的关系。结果描述了一种确定膜片自由区域中膜电阻大小的方法，并证明：（a）在给定的分流电阻值下，电阻率较高的膜区域在获取膜囊泡时总膜片电路电阻的比例增加较小；（b）假定形成球形囊泡可提供膜电阻的下限估计。所描述的程序和关系有助于开发新技术，用于检测单个事件低于当前检测限的膜片中的通道活性，用于检测经历细胞骨架重组的膜片中膜电阻率和/或分流电阻的变化，以及用于评估长期细胞贴附式膜片钳记录中串联电阻变化对单通道参数的潜在影响。
