Leadley S R, Davies M C, Ribeiro C C, Barbosa M A, Paul A J, Watts J F
Department of Pharmaceutical Sciences, University of Nottingham, UK.
Biomaterials. 1997 Feb;18(4):311-6. doi: 10.1016/s0142-9612(96)00134-2.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) analyses have been used to investigate the dissolution of hydroxyapatite in the presence of titanium chloride suggesting the substitution of titanium ions for calcium in the hydroxyapatite structure. The surface analytical data suggest that titanium was incorporated within the solid phase as titanium phosphate. Comparison of relative ion intensities in the ToF-SIMS spectra reveals changes in the composition of the surface chemistry of hydroxyapatite. These relative ion intensities show that the maximum surface uptake of titanium occurred at a solution concentration of 500 ppm titanium chloride for a time of incubation of 30 min. These data correlate with that obtained using XPS highlighting the semi-quantitative information which ToF-SIMS can provide.
飞行时间二次离子质谱（ToF-SIMS）和X射线光电子能谱（XPS）分析已被用于研究在氯化钛存在下羟基磷灰石的溶解情况，这表明钛离子在羟基磷灰石结构中取代了钙。表面分析数据表明，钛以磷酸钛的形式掺入固相。ToF-SIMS光谱中相对离子强度的比较揭示了羟基磷灰石表面化学组成的变化。这些相对离子强度表明，在30分钟的孵育时间内，当溶液中氯化钛浓度为500 ppm时，钛的表面吸收量最大。这些数据与使用XPS获得的数据相关，突出了ToF-SIMS所能提供的半定量信息。
