Scanning Tunneling Microscopy Study of the Thick Film Limit of Kinetic Roughening.

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作者信息

Palasantzas G, Krim J

出版信息

Phys Rev Lett. 1994 Dec 26;73(26):3564-3567. doi: 10.1103/PhysRevLett.73.3564.

DOI:10.1103/PhysRevLett.73.3564

PMID:10057415

Abstract

摘要

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Scanning Tunneling Microscopy Study of the Thick Film Limit of Kinetic Roughening.

Phys Rev Lett. 1994 Dec 26;73(26):3564-3567. doi: 10.1103/PhysRevLett.73.3564.

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