• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利：CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法，用中文像聊天一样搜索，搜遍4000万医学文献。AI智能推荐，让科研检索更轻松。

立即免费搜索

文件翻译

保留排版，准确专业，支持PDF/Word/PPT等文件格式，支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述，25分钟生成高质量综述，智能提取关键信息，辅助科研写作。

立即免费体验

Electron crystallography in surface structure analysis.

作者信息

Leslie C, Landree E, Collazo-Davila C, Bengu E, Grozea D, Marks L D

机构信息

Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA.

出版信息

Microsc Res Tech. 1999 Aug 1;46(3):160-77. doi: 10.1002/(SICI)1097-0029(19990801)46:3<160::AID-JEMT2>3.0.CO;2-#.

DOI:10.1002/(SICI)1097-0029(19990801)46:3<160::AID-JEMT2>3.0.CO;2-#
PMID:10420173
Abstract

Surface structure analysis is an important area of research, and in recent years notable advances have been made in this field, both in improved techniques for studying surfaces and in methods of analyzing them. This review aims to summarize the techniques available, particularly those relating to electron microscopy, and also to outline one of the newest areas of development, the application of direct methods to surface structure analysis.

摘要

相似文献

1
Electron crystallography in surface structure analysis.
Microsc Res Tech. 1999 Aug 1;46(3):160-77. doi: 10.1002/(SICI)1097-0029(19990801)46:3<160::AID-JEMT2>3.0.CO;2-#.
2
Direct methods in electron crystallography: image processing and solving incommensurate structures.
Microsc Res Tech. 1999 Jul 15;46(2):104-16. doi: 10.1002/(SICI)1097-0029(19990715)46:2<104::AID-JEMT4>3.0.CO;2-Z.
3
Electron crystallography at atomic resolution: the structure of the odd-chain paraffin n-tritriacontane.原子分辨率下的电子晶体学：奇数链石蜡正三十三烷的结构
J Electron Microsc Tech. 1991 Jun;18(2):142-7. doi: 10.1002/jemt.1060180208.
4
On the phase problem in electron microscopy: the relationship between structure factors, exit waves, and HREM images.关于电子显微镜中的相位问题：结构因子、出射波与高分辨电子显微镜图像之间的关系。
Microsc Res Tech. 1999 Aug 1;46(3):202-19. doi: 10.1002/(SICI)1097-0029(19990801)46:3<202::AID-JEMT4>3.0.CO;2-8.
5
Electron crystallography and non-linear optics.
Microsc Res Tech. 1999 Aug 1;46(3):178-201. doi: 10.1002/(SICI)1097-0029(19990801)46:3<178::AID-JEMT3>3.0.CO;2-M.
6
Maximum entropy methods in electron crystallography.电子晶体学中的最大熵方法。
Microsc Res Tech. 1999 Jul 15;46(2):117-29. doi: 10.1002/(SICI)1097-0029(19990715)46:2<117::AID-JEMT5>3.0.CO;2-Q.
7
XMIPP: a new generation of an open-source image processing package for electron microscopy.XMIPP：新一代用于电子显微镜的开源图像处理软件包。
J Struct Biol. 2004 Nov;148(2):194-204. doi: 10.1016/j.jsb.2004.06.006.
8
Prospects for the direct electron crystallographic determination of zeolite structures.沸石结构直接电子晶体学测定的前景。
Microsc Res Tech. 1997 Feb 1;36(3):212-23. doi: 10.1002/(SICI)1097-0029(19970201)36:3<212::AID-JEMT9>3.0.CO;2-Q.
9
Recent developments in electron holography for phase microscopy.用于相显微镜的电子全息术的最新进展。
J Electron Microsc (Tokyo). 1995 Dec;44(6):425-35.
10
Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling.采用背散射离子研磨制备样品的二维掺杂剂分布测量的电子全息研究。
J Electron Microsc (Tokyo). 2008 Jan;57(1):13-8. doi: 10.1093/jmicro/dfm037. Epub 2008 Jan 5.

引用本文的文献

1
Differential properties of transcriptional complexes formed by the CoREST family.由CoREST家族形成的转录复合物的差异特性。
Mol Cell Biol. 2014 Jul;34(14):2760-70. doi: 10.1128/MCB.00083-14.